Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy

This is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this documen...

Descripción completa

Detalles Bibliográficos
Autores: Castellano-Hernández, Elena, Moreno Llorena, Jaime, Sáenz Gutiérrez, Juan José, Gómez Moñivas, Sacha
Tipo de recurso: artículo
Fecha de publicación:2012
País:España
Institución:Universidad Autónoma de Madrid
Repositorio:Biblos-e Archivo. Repositorio Institucional de la UAM
Idioma:inglés
OAI Identifier:oai:repositorio.uam.es:10486/665597
Acceso en línea:http://hdl.handle.net/10486/665597
https://dx.doi.org/10.1088/0953-8984/24/15/155303
Access Level:acceso abierto
Palabra clave:Condensed matter
Surfaces, interfaces and thin films
Física
Informática
id ES_32089bdc8fd2cffdb10a56676ae01847
oai_identifier_str oai:repositorio.uam.es:10486/665597
network_acronym_str ES
network_name_str España
repository_id_str
spelling Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopyCastellano-Hernández, ElenaMoreno Llorena, JaimeSáenz Gutiérrez, Juan JoséGómez Moñivas, SachaCondensed matterSurfaces, interfaces and thin filmsFísicaInformáticaThis is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Physics: Condensed Matter 24.15 (2012) 10.1088/0953-8984/24/15/155303Electrostatic Force Microscopy has been shown to be a useful tool to determine the dielectric constant of insulating films of nanometer thicknesses that play a key role in many electrical, optical and biological phenomena. Previous approaches make use of simple analytical formulae to analyse the experimental data for thin insulating films deposited directly on a metallic substrate. Here we show that the sensitivity of the EFM signal to changes in the dielectric constant of the thin film can be enhanced by using dielectric substrates with low dielectric constants. We present detailed numerical calculations of the tip-sample electrostatic interaction in the following set-up: the insulating thin film, a dielectric substrate (or spacing layer) of known low dielectric constant and a metallic electrode. The EFM sensitivity to the dielectric constant increases with the thickness of the spacing layer and saturates for thicknesses above 100-300 nm, when it is close to that of an infinite medium.Authors acknowledge C. Gómez-Navarro, J. Gómez-Herrero, P. Varona and F. Rodríguez for insightful discussions. This work was supported by TIN2010-19607, the Spanish MICINN ( Grant No: FIS2009 − 13430 −C02 − 02 ) and by the Comunidad de Madrid Microseres Program (Grant No: S2009/T IC − 1476). GMS acknowledges support from the Spanish Ramón y Cajal Program.Institute of Physics Publishing Ltd.Departamento de Física de la Materia CondensadaDepartamento de Ingeniería InformáticaEscuela Politécnica SuperiorHerramientas Interactivas Avanzadas (ING EPS-003)Neurocomputación Biológica (ING EPS-005)20122012-04-18research articlehttp://purl.org/coar/resource_type/c_2df8fbb1AMhttp://purl.org/coar/version/c_ab4af688f83e57aainfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10486/665597https://dx.doi.org/10.1088/0953-8984/24/15/155303reponame:Biblos-e Archivo. Repositorio Institucional de la UAMinstname:Universidad Autónoma de MadridInglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:repositorio.uam.es:10486/6655972026-06-23T12:46:27Z
dc.title.none.fl_str_mv Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
title Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
spellingShingle Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
Castellano-Hernández, Elena
Condensed matter
Surfaces, interfaces and thin films
Física
Informática
title_short Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
title_full Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
title_fullStr Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
title_full_unstemmed Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
title_sort Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
dc.creator.none.fl_str_mv Castellano-Hernández, Elena
Moreno Llorena, Jaime
Sáenz Gutiérrez, Juan José
Gómez Moñivas, Sacha
author Castellano-Hernández, Elena
author_facet Castellano-Hernández, Elena
Moreno Llorena, Jaime
Sáenz Gutiérrez, Juan José
Gómez Moñivas, Sacha
author_role author
author2 Moreno Llorena, Jaime
Sáenz Gutiérrez, Juan José
Gómez Moñivas, Sacha
author2_role author
author
author
dc.contributor.none.fl_str_mv Departamento de Física de la Materia Condensada
Departamento de Ingeniería Informática
Escuela Politécnica Superior
Herramientas Interactivas Avanzadas (ING EPS-003)
Neurocomputación Biológica (ING EPS-005)
dc.subject.none.fl_str_mv Condensed matter
Surfaces, interfaces and thin films
Física
Informática
topic Condensed matter
Surfaces, interfaces and thin films
Física
Informática
description This is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Physics: Condensed Matter 24.15 (2012) 10.1088/0953-8984/24/15/155303
publishDate 2012
dc.date.none.fl_str_mv 2012
2012-04-18
dc.type.none.fl_str_mv research article
http://purl.org/coar/resource_type/c_2df8fbb1
AM
http://purl.org/coar/version/c_ab4af688f83e57aa
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10486/665597
https://dx.doi.org/10.1088/0953-8984/24/15/155303
url http://hdl.handle.net/10486/665597
https://dx.doi.org/10.1088/0953-8984/24/15/155303
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Institute of Physics Publishing Ltd.
publisher.none.fl_str_mv Institute of Physics Publishing Ltd.
dc.source.none.fl_str_mv reponame:Biblos-e Archivo. Repositorio Institucional de la UAM
instname:Universidad Autónoma de Madrid
instname_str Universidad Autónoma de Madrid
reponame_str Biblos-e Archivo. Repositorio Institucional de la UAM
collection Biblos-e Archivo. Repositorio Institucional de la UAM
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869405649708777472
score 15,300719

Similares en LA Referencia