Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
This is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this documen...
| Autores: | , , , |
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| Formato: | artículo |
| Fecha de publicación: | 2012 |
| País: | España |
| Recursos: | Universidad Autónoma de Madrid |
| Repositorio: | Biblos-e Archivo. Repositorio Institucional de la UAM |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.uam.es:10486/665597 |
| Acesso em linha: | http://hdl.handle.net/10486/665597 https://dx.doi.org/10.1088/0953-8984/24/15/155303 |
| Access Level: | acceso abierto |
| Palavra-chave: | Condensed matter Surfaces, interfaces and thin films Física Informática |
| Resumo: | This is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Physics: Condensed Matter 24.15 (2012) 10.1088/0953-8984/24/15/155303 |
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