Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lis...
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2013 |
| País: | España |
| Institución: | Universidad Autónoma de Madrid |
| Repositorio: | Biblos-e Archivo. Repositorio Institucional de la UAM |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.uam.es:10486/665558 |
| Acceso en línea: | http://hdl.handle.net/10486/665558 https://dx.doi.org/10.1109/TNANO.2012.2235081 |
| Access Level: | acceso abierto |
| Palabra clave: | Electrostatic force microscopy Thin films Informática |
| Sumario: | Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. G. M. Sacha, "Influence of the Substrate and Tip Shape on the Characterization of Thin Films by Electrostatic Force Microscopy", IEEE Transactions on Nanotechnology, vol.12, no.2, pp.152-156, Marzo 2013. |
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