Castellano-Hernández, E., Moreno Llorena, J., Sáenz Gutiérrez, J. J., & Gómez Moñivas, S. (2012). Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy.
Citación estilo ChicagoCastellano-Hernández, Elena, Jaime Moreno Llorena, Juan José Sáenz Gutiérrez, y Sacha Gómez Moñivas. Enhanced Dielectric Constant Resolution of Thin Insulating Films By Electrostatic Force Microscopy. 2012.
Cita MLACastellano-Hernández, Elena, Jaime Moreno Llorena, Juan José Sáenz Gutiérrez, y Sacha Gómez Moñivas. Enhanced Dielectric Constant Resolution of Thin Insulating Films By Electrostatic Force Microscopy. 2012.
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