Experimental time evolution study of the HFO-based IMPLY gate operation

© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to se...

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Detalles Bibliográficos
Autores: Maestro, M, Marin-Martinez, J., Crespo-Yepes, A., Escudero, Manel, Rodriguez, R., Nafría Maqueda, Montserrat|||0000-0002-9549-2890, Aymerich, X., Rubio Sola, Jose Antonio|||0000-0003-1625-1472
Tipo de recurso: artículo
Fecha de publicación:2018
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/113202
Acceso en línea:https://hdl.handle.net/2117/113202
https://dx.doi.org/10.1109/TED.2017.2778315
Access Level:acceso abierto
Palabra clave:Electronic circuits
Electrodes
Resistive Switching
Material Implication
IMPLY
logic
memristors
Circuits electrònics
Elèctrodes
Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
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Sumario:© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.