Patent Overlay Mapping: Visualizing Technological Distance

This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global p...

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Detalles Bibliográficos
Autores: Kay L., Newman, N., Youtie, J., Porter A.L., Rafols García, Ismael
Tipo de recurso: artículo
Fecha de publicación:2014
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/44358
Acceso en línea:https://riunet.upv.es/handle/10251/44358
Access Level:acceso abierto
Palabra clave:Information mapping
Innovation
Patents
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spelling Patent Overlay Mapping: Visualizing Technological DistanceKay L.Newman, N.Youtie, J.Porter A.L.Rafols García, IsmaelInformation mappingInnovationPatentsThis paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global patent map is based on similarities in citing-to-cited relationships between categories of the International Patent Classification (IPC) of European Patent Office (EPO) patents from 2000 to 2006. This patent data set, extracted from the PATSTAT database, includes 760,000 patent records in 466 IPC-based categories. We compare the global patent maps derived from this categorization to related efforts of other global patent maps. The paper overlays the nanotechnology-related patenting activities of two companies and two different nanotechnology subfields on the global patent map. The exercise shows the potential of patent overlay maps to visualize technological areas and potentially support decision making. Furthermore, this study shows that IPC categories that are similar to one another based on citing-to-cited patterns (and thus close in the global patent map) are not necessarily in the same hierarchical IPC branch, thereby revealing new relationships between technologies that are classified as pertaining to different (and sometimes distant) subject areas in the IPC scheme.We thank Kevin Boyack, Loet Leydesdorff, and Antoine Schoen for open and fruitful discussions about this paper. This research was undertaken largely at Georgia Tech drawing on support from the U.S. National Science Foundation (NSF) through the Center for Nanotechnology in Society (Arizona State University; Award No. 0531194); and NSF Award No. 1064146 ("Revealing Innovation Pathways: Hybrid Science Maps for Technology Assessment and Foresight"). Part of this research was also undertaken in collaboration with the Center for Nanotechnology in Society, University of California Santa Barbara (NSF Awards No. 0938099 and No. 0531184). The findings and observations contained in this paper are those of the authors and do not necessarily reflect the views of the US National Science Foundation.Association for Information Science and Technology (ASIS&T): JASIS&TNational Science Foundation, EEUURepositorio Institucional de la Universitat Politècnica de València Riunet20142014-05-07journal articlehttp://purl.org/coar/resource_type/c_6501VoRhttp://purl.org/coar/version/c_970fb48d4fbd8a85info:eu-repo/semantics/articleapplication/pdfapplication/pdfhttps://riunet.upv.es/handle/10251/44358reponame:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valénciainstname:Universitat Politècnica de València (UPV)InglésengNational Science Foundation, China https://doi.org/10.13039/100000001 1064146 TLS: Revealing Innovation PathwaysNational Science Foundation, China https://doi.org/10.13039/100000001 0531184 NSEC: Center for Nanotechnology in Society at University of California, Santa BarbaraNational Science Foundation, China https://doi.org/10.13039/100000001 0938099 NSEC: Center for Nanotechnology in Society at University of California, Santa BarbaraNational Science Foundation, China https://doi.org/10.13039/100000001 0531194 NSEC: Center for Nanotechnology in Society at Arizona State Universityopen accesshttp://purl.org/coar/access_right/c_abf2Reserva de todos los derechoshttp://rightsstatements.org/vocab/InC/1.0/info:eu-repo/semantics/openAccessoai:riunet.upv.es:10251/443582026-06-13T07:49:27Z
dc.title.none.fl_str_mv Patent Overlay Mapping: Visualizing Technological Distance
title Patent Overlay Mapping: Visualizing Technological Distance
spellingShingle Patent Overlay Mapping: Visualizing Technological Distance
Kay L.
Information mapping
Innovation
Patents
title_short Patent Overlay Mapping: Visualizing Technological Distance
title_full Patent Overlay Mapping: Visualizing Technological Distance
title_fullStr Patent Overlay Mapping: Visualizing Technological Distance
title_full_unstemmed Patent Overlay Mapping: Visualizing Technological Distance
title_sort Patent Overlay Mapping: Visualizing Technological Distance
dc.creator.none.fl_str_mv Kay L.
Newman, N.
Youtie, J.
Porter A.L.
Rafols García, Ismael
author Kay L.
author_facet Kay L.
Newman, N.
Youtie, J.
Porter A.L.
Rafols García, Ismael
author_role author
author2 Newman, N.
Youtie, J.
Porter A.L.
Rafols García, Ismael
author2_role author
author
author
author
dc.contributor.none.fl_str_mv National Science Foundation, EEUU
Repositorio Institucional de la Universitat Politècnica de València Riunet
dc.subject.none.fl_str_mv Information mapping
Innovation
Patents
topic Information mapping
Innovation
Patents
description This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global patent map is based on similarities in citing-to-cited relationships between categories of the International Patent Classification (IPC) of European Patent Office (EPO) patents from 2000 to 2006. This patent data set, extracted from the PATSTAT database, includes 760,000 patent records in 466 IPC-based categories. We compare the global patent maps derived from this categorization to related efforts of other global patent maps. The paper overlays the nanotechnology-related patenting activities of two companies and two different nanotechnology subfields on the global patent map. The exercise shows the potential of patent overlay maps to visualize technological areas and potentially support decision making. Furthermore, this study shows that IPC categories that are similar to one another based on citing-to-cited patterns (and thus close in the global patent map) are not necessarily in the same hierarchical IPC branch, thereby revealing new relationships between technologies that are classified as pertaining to different (and sometimes distant) subject areas in the IPC scheme.
publishDate 2014
dc.date.none.fl_str_mv 2014
2014-05-07
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
VoR
http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://riunet.upv.es/handle/10251/44358
url https://riunet.upv.es/handle/10251/44358
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.relation.none.fl_str_mv National Science Foundation, China https://doi.org/10.13039/100000001 1064146 TLS: Revealing Innovation Pathways
National Science Foundation, China https://doi.org/10.13039/100000001 0531184 NSEC: Center for Nanotechnology in Society at University of California, Santa Barbara
National Science Foundation, China https://doi.org/10.13039/100000001 0938099 NSEC: Center for Nanotechnology in Society at University of California, Santa Barbara
National Science Foundation, China https://doi.org/10.13039/100000001 0531194 NSEC: Center for Nanotechnology in Society at Arizona State University
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
Reserva de todos los derechos
http://rightsstatements.org/vocab/InC/1.0/
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
Reserva de todos los derechos
http://rightsstatements.org/vocab/InC/1.0/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Association for Information Science and Technology (ASIS&T): JASIS&T
publisher.none.fl_str_mv Association for Information Science and Technology (ASIS&T): JASIS&T
dc.source.none.fl_str_mv reponame:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
instname:Universitat Politècnica de València (UPV)
instname_str Universitat Politècnica de València (UPV)
reponame_str RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
collection RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
repository.name.fl_str_mv
repository.mail.fl_str_mv
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