Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC)

[EN] We report on the development of an interface to the US Patent and Trademark Office (USPTO) that allows for the mapping of patent portfolios as overlays to basemaps constructed from citation relations among all patents contained in this database during the period 1976-2011. Both the interface an...

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Detalles Bibliográficos
Autores: Leydesdorff, L., Kushnir, Duncan, Ismael Rafols
Tipo de recurso: artículo
Fecha de publicación:2014
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/86315
Acceso en línea:https://riunet.upv.es/handle/10251/86315
Access Level:acceso abierto
Palabra clave:Map
USPTO
IPC
Patent
Classification
Overlay
Descripción
Sumario:[EN] We report on the development of an interface to the US Patent and Trademark Office (USPTO) that allows for the mapping of patent portfolios as overlays to basemaps constructed from citation relations among all patents contained in this database during the period 1976-2011. Both the interface and the data are in the public domain; the freeware programs VOSViewer and/or Pajek can be used for the visualization. These basemaps and overlays can be generated at both the 3-digit and 4-digit levels of the International Patent Classification (IPC) of the world intellectual property organization (WIPO). The basemaps can provide a stable mental framework for analysts to follow developments over searches for different years, which can be animated. The full flexibility of the advanced search engines of USPTO are available for generating sets of patents and/or patent applications which can thus be visualized and compared. This instrument allows for addressing questions about technological distance, diversity in portfolios, and animating the developments of both technologies and technological capacities of organizations over time.