Patent overlay mapping: Visualizing technological distance

arXiv:1208.4380

Detalhes bibliográficos
Autores: Kay, Luciano, Newman, Nils, Youtie, Jan, Porter, Alan L., Rafols, Ismael
Formato: artículo
Estado:Versión enviada para evaluación y publicación
Fecha de publicación:2014
País:España
Recursos:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/132054
Acesso em linha:http://hdl.handle.net/10261/132054
Access Level:acceso abierto
Palavra-chave:Innovation
Information mapping
Patents
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spelling Patent overlay mapping: Visualizing technological distanceKay, LucianoNewman, NilsYoutie, JanPorter, Alan L.Rafols, IsmaelInnovationInformation mappingPatentsarXiv:1208.4380This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global patent map is based on similarities in citing-to-cited relationships between categories of the International Patent Classification (IPC) of European Patent Office (EPO) patents from 2000 to 2006. This patent data set, extracted from the PATSTAT database, includes 760,000 patent records in 466 IPC-based categories. We compare the global patent maps derived from this categorization to related efforts of other global patent maps. The paper overlays the nanotechnology-related patenting activities of two companies and two different nanotechnology subfields on the global patent map. The exercise shows the potential of patent overlay maps to visualize technological areas and potentially support decision making. Furthermore, this study shows that IPC categories that are similar to one another based on citing-to-cited patterns (and thus close in the global patent map) are not necessarily in the same hierarchical IPC branch, thereby revealing new relationships between technologies that are classified as pertaining to different (and sometimes distant) subject areas in the IPC scheme.This research was undertaken largely at Georgia Tech drawing on support from the U.S. National Science Foundation (NSF) through the Center for Nanotechnology in Society (Arizona State University; Award No. 0531194); and NSF Award No. 1064146 (“Revealing Innovation Pathways: Hybrid Science Maps for Technology Assessment and Foresight”). Part of this research was also undertaken in collaboration with the Center for Nanotechnology in Society, University of California Santa Barbara (NSF Awards No. 0938099 and No. 0531184).Peer ReviewedJohn Wiley & SonsGeorgia Institute of Technology (US)University of CaliforniaNational Science Foundation (US)Arizona State UniversityConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]2016201620142016info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Preprintinfo:eu-repo/semantics/submittedVersionhttp://hdl.handle.net/10261/132054reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttp://dx.doi.org/10.1002/asi.23146Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/1320542026-05-22T06:33:51Z
dc.title.none.fl_str_mv Patent overlay mapping: Visualizing technological distance
title Patent overlay mapping: Visualizing technological distance
spellingShingle Patent overlay mapping: Visualizing technological distance
Kay, Luciano
Innovation
Information mapping
Patents
title_short Patent overlay mapping: Visualizing technological distance
title_full Patent overlay mapping: Visualizing technological distance
title_fullStr Patent overlay mapping: Visualizing technological distance
title_full_unstemmed Patent overlay mapping: Visualizing technological distance
title_sort Patent overlay mapping: Visualizing technological distance
dc.creator.none.fl_str_mv Kay, Luciano
Newman, Nils
Youtie, Jan
Porter, Alan L.
Rafols, Ismael
author Kay, Luciano
author_facet Kay, Luciano
Newman, Nils
Youtie, Jan
Porter, Alan L.
Rafols, Ismael
author_role author
author2 Newman, Nils
Youtie, Jan
Porter, Alan L.
Rafols, Ismael
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Georgia Institute of Technology (US)
University of California
National Science Foundation (US)
Arizona State University
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Innovation
Information mapping
Patents
topic Innovation
Information mapping
Patents
description arXiv:1208.4380
publishDate 2014
dc.date.none.fl_str_mv 2014
2016
2016
2016
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Preprint
info:eu-repo/semantics/submittedVersion
format article
status_str submittedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/132054
url http://hdl.handle.net/10261/132054
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv http://dx.doi.org/10.1002/asi.23146
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv John Wiley & Sons
publisher.none.fl_str_mv John Wiley & Sons
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,812429

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