Cita APA

Kay, L., Newman, N., Youtie, J., Porter, A. L., & Rafols, I. (2014). Patent overlay mapping: Visualizing technological distance.

Citación estilo Chicago

Kay, Luciano, Nils Newman, Jan Youtie, Alan L. Porter, y Ismael Rafols. Patent Overlay Mapping: Visualizing Technological Distance. 2014.

Cita MLA

Kay, Luciano, et al. Patent Overlay Mapping: Visualizing Technological Distance. 2014.