Detection and measurement of waviness on thin metallic wires

We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, w...

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Detalles Bibliográficos
Autores: Tejeda, César, Sánchez Brea, Luis Miguel, Bernabeu Martínez, Eusebio
Tipo de recurso: artículo
Fecha de publicación:2004
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/51205
Acceso en línea:https://hdl.handle.net/20.500.14352/51205
Access Level:acceso abierto
Palabra clave:535
Diffracyion
Diameter
Óptica (Física)
2209.19 Óptica Física
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repository_id_str
spelling Detection and measurement of waviness on thin metallic wiresTejeda, CésarSánchez Brea, Luis MiguelBernabeu Martínez, Eusebio535DiffracyionDiameterÓptica (Física)2209.19 Óptica FísicaWe propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, which are in accordance with our theoretical description.The Optical Society Of AmericaUniversidad Complutense de Madrid20042004-03-0120042004-03-01journal articlehttp://purl.org/coar/resource_type/c_6501info:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/20.500.14352/51205reponame:Docta Complutenseinstname:Universidad Complutense de Madrid (UCM)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:docta.ucm.es:20.500.14352/512052026-06-02T12:44:21Z
dc.title.none.fl_str_mv Detection and measurement of waviness on thin metallic wires
title Detection and measurement of waviness on thin metallic wires
spellingShingle Detection and measurement of waviness on thin metallic wires
Tejeda, César
535
Diffracyion
Diameter
Óptica (Física)
2209.19 Óptica Física
title_short Detection and measurement of waviness on thin metallic wires
title_full Detection and measurement of waviness on thin metallic wires
title_fullStr Detection and measurement of waviness on thin metallic wires
title_full_unstemmed Detection and measurement of waviness on thin metallic wires
title_sort Detection and measurement of waviness on thin metallic wires
dc.creator.none.fl_str_mv Tejeda, César
Sánchez Brea, Luis Miguel
Bernabeu Martínez, Eusebio
author Tejeda, César
author_facet Tejeda, César
Sánchez Brea, Luis Miguel
Bernabeu Martínez, Eusebio
author_role author
author2 Sánchez Brea, Luis Miguel
Bernabeu Martínez, Eusebio
author2_role author
author
dc.contributor.none.fl_str_mv Universidad Complutense de Madrid
dc.subject.none.fl_str_mv 535
Diffracyion
Diameter
Óptica (Física)
2209.19 Óptica Física
topic 535
Diffracyion
Diameter
Óptica (Física)
2209.19 Óptica Física
description We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, which are in accordance with our theoretical description.
publishDate 2004
dc.date.none.fl_str_mv 2004
2004-03-01
2004
2004-03-01
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.14352/51205
url https://hdl.handle.net/20.500.14352/51205
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv The Optical Society Of America
publisher.none.fl_str_mv The Optical Society Of America
dc.source.none.fl_str_mv reponame:Docta Complutense
instname:Universidad Complutense de Madrid (UCM)
instname_str Universidad Complutense de Madrid (UCM)
reponame_str Docta Complutense
collection Docta Complutense
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869419350152183808
score 15,301603

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