Detection and measurement of waviness on thin metallic wires
We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, w...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2004 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/51205 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/51205 |
| Access Level: | acceso abierto |
| Palabra clave: | 535 Diffracyion Diameter Óptica (Física) 2209.19 Óptica Física |
| Sumario: | We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, which are in accordance with our theoretical description. |
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