Microwave noise parameter measurements of a high temperature superconducting flux flow transistor
The noise parameters of a high-temperature superconducting (HTS) flux flow transistor made of TlBaCaCuO operating at 77 K and 3-5 GHz were experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line,...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 1991 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/1016 |
| Acceso en línea: | https://hdl.handle.net/2117/1016 |
| Access Level: | acceso abierto |
| Palabra clave: | High temperature superconductors Microwave measurements barium compounds calcium compounds electric noise measurement electron device noise flux flow high-temperature superconductors microwave measurement superconducting junction devices thallium compounds Superconductors a altes temperatures Microones -- Mesurament Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
| Sumario: | The noise parameters of a high-temperature superconducting (HTS) flux flow transistor made of TlBaCaCuO operating at 77 K and 3-5 GHz were experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line, is due to the statistical nature of flux nucleation and motion in the links. The noise parameters dictate the dependence of the noise figure on the source impedance, and are calculated by measuring source impedances. Sensitivity analysis is used to estimate the accuracy of the measurements. The measurements indicate a minimum noise figure of less than 1 dB at 3 GHz. |
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