Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors
This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2003 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/1073 |
| Acceso en línea: | https://hdl.handle.net/2117/1073 |
| Access Level: | acceso abierto |
| Palabra clave: | High temperature superconductors Superconductivity high-temperature superconductors intermodulation distortion superconducting cavity resonators superconducting microwave devices superconducting thin films Superconductors a altes temperatures Superconductivitat Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
| Sumario: | This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films. |
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