Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges

We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC...

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Detalles Bibliográficos
Autores: Nguyen, T. D., O'Callaghan Castellà, Juan Manuel|||0000-0002-2740-0202, Davidson, B. A., Redwing, R. D., Hohenwarter, G. K. G., Nordman, J. E., Beyer, J. B.
Tipo de recurso: artículo
Fecha de publicación:1995
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/991
Acceso en línea:https://hdl.handle.net/2117/991
Access Level:acceso abierto
Palabra clave:High temperature superconductors
Superconductivity
1/f noise
barium compounds
flux flow
flux pinning
high-temperature superconductors
superconducting device noise
superconducting device testing
superconducting microbridges
superconducting thin films
yttrium compounds
Superconductors a altes temperatures
Superconductivitat
Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
Descripción
Sumario:We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage.

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