New weighted time lag method for the analysis of random telegraph signals

A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The resul...

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Authors: Martin Martinez, Javier|||0000-0001-5938-5898, Diaz-Fortuny, Javier|||0000-0002-8186-071X, Rodríguez Martínez, Rosana|||0000-0002-4565-6703, Nafria, Montserrat|||0000-0002-9549-2890, Aymerich Humet, Xavier|||0000-0002-5874-6257
Format: article
Publication Date:2014
Country:España
Institution:Universitat Autònoma de Barcelona
Repository:Dipòsit Digital de Documents de la UAB
Language:English
OAI Identifier:oai:ddd.uab.cat:324480
Online Access:https://ddd.uab.cat/record/324480
https://dx.doi.org/urn:doi:10.1109/LED.2014.2304673
Access Level:Open access
Keyword:Characterization
CMOS
Noise
Parameter extraction
Random telegraph signals
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spelling New weighted time lag method for the analysis of random telegraph signalsMartin Martinez, Javier|||0000-0001-5938-5898Diaz-Fortuny, Javier|||0000-0002-8186-071XRodríguez Martínez, Rosana|||0000-0002-4565-6703Nafria, Montserrat|||0000-0002-9549-2890Aymerich Humet, Xavier|||0000-0002-5874-6257CharacterizationCMOSNoiseParameter extractionRandom telegraph signalsA new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant. © 1980-2012 IEEE. 22014-01-0120142014-01-01Articlehttp://purl.org/coar/resource_type/c_6501AMhttp://purl.org/coar/version/c_ab4af688f83e57aainfo:eu-repo/semantics/articleapplication/pdfhttps://ddd.uab.cat/record/324480https://dx.doi.org/urn:doi:10.1109/LED.2014.2304673reponame:Dipòsit Digital de Documents de la UABinstname:Universitat Autònoma de BarcelonaInglésengopen accesshttp://purl.org/coar/access_right/c_abf2Aquest material està protegit per drets d'autor i/o drets afins. Podeu utilitzar aquest material en funció del que permet la legislació de drets d'autor i drets afins d'aplicació al vostre cas. Per a d'altres usos heu d'obtenir permís del(s) titular(s) de drets.https://rightsstatements.org/vocab/InC/1.0/info:eu-repo/semantics/openAccessoai:ddd.uab.cat:3244802026-06-06T12:50:31Z
dc.title.none.fl_str_mv New weighted time lag method for the analysis of random telegraph signals
title New weighted time lag method for the analysis of random telegraph signals
spellingShingle New weighted time lag method for the analysis of random telegraph signals
Martin Martinez, Javier|||0000-0001-5938-5898
Characterization
CMOS
Noise
Parameter extraction
Random telegraph signals
title_short New weighted time lag method for the analysis of random telegraph signals
title_full New weighted time lag method for the analysis of random telegraph signals
title_fullStr New weighted time lag method for the analysis of random telegraph signals
title_full_unstemmed New weighted time lag method for the analysis of random telegraph signals
title_sort New weighted time lag method for the analysis of random telegraph signals
dc.creator.none.fl_str_mv Martin Martinez, Javier|||0000-0001-5938-5898
Diaz-Fortuny, Javier|||0000-0002-8186-071X
Rodríguez Martínez, Rosana|||0000-0002-4565-6703
Nafria, Montserrat|||0000-0002-9549-2890
Aymerich Humet, Xavier|||0000-0002-5874-6257
author Martin Martinez, Javier|||0000-0001-5938-5898
author_facet Martin Martinez, Javier|||0000-0001-5938-5898
Diaz-Fortuny, Javier|||0000-0002-8186-071X
Rodríguez Martínez, Rosana|||0000-0002-4565-6703
Nafria, Montserrat|||0000-0002-9549-2890
Aymerich Humet, Xavier|||0000-0002-5874-6257
author_role author
author2 Diaz-Fortuny, Javier|||0000-0002-8186-071X
Rodríguez Martínez, Rosana|||0000-0002-4565-6703
Nafria, Montserrat|||0000-0002-9549-2890
Aymerich Humet, Xavier|||0000-0002-5874-6257
author2_role author
author
author
author
dc.subject.none.fl_str_mv Characterization
CMOS
Noise
Parameter extraction
Random telegraph signals
topic Characterization
CMOS
Noise
Parameter extraction
Random telegraph signals
description A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant. © 1980-2012 IEEE.
publishDate 2014
dc.date.none.fl_str_mv 2
2014-01-01
2014
2014-01-01
dc.type.none.fl_str_mv Article
http://purl.org/coar/resource_type/c_6501
AM
http://purl.org/coar/version/c_ab4af688f83e57aa
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://ddd.uab.cat/record/324480
https://dx.doi.org/urn:doi:10.1109/LED.2014.2304673
url https://ddd.uab.cat/record/324480
https://dx.doi.org/urn:doi:10.1109/LED.2014.2304673
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
https://rightsstatements.org/vocab/InC/1.0/
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
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eu_rights_str_mv openAccess
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dc.source.none.fl_str_mv reponame:Dipòsit Digital de Documents de la UAB
instname:Universitat Autònoma de Barcelona
instname_str Universitat Autònoma de Barcelona
reponame_str Dipòsit Digital de Documents de la UAB
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