New weighted time lag method for the analysis of random telegraph signals

A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The resul...

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Detalhes bibliográficos
Autores: Martin Martinez, Javier|||0000-0001-5938-5898, Diaz-Fortuny, Javier|||0000-0002-8186-071X, Rodríguez Martínez, Rosana|||0000-0002-4565-6703, Nafria, Montserrat|||0000-0002-9549-2890, Aymerich Humet, Xavier|||0000-0002-5874-6257
Formato: artículo
Fecha de publicación:2014
País:España
Recursos:Universitat Autònoma de Barcelona
Repositorio:Dipòsit Digital de Documents de la UAB
Idioma:inglés
OAI Identifier:oai:ddd.uab.cat:324480
Acesso em linha:https://ddd.uab.cat/record/324480
https://dx.doi.org/urn:doi:10.1109/LED.2014.2304673
Access Level:acceso abierto
Palavra-chave:Characterization
CMOS
Noise
Parameter extraction
Random telegraph signals
Descrição
Resumo:A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant. © 1980-2012 IEEE.

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