New weighted time lag method for the analysis of random telegraph signals
A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The resul...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2014 |
| País: | España |
| Institución: | Universitat Autònoma de Barcelona |
| Repositorio: | Dipòsit Digital de Documents de la UAB |
| Idioma: | inglés |
| OAI Identifier: | oai:ddd.uab.cat:324480 |
| Acceso en línea: | https://ddd.uab.cat/record/324480 https://dx.doi.org/urn:doi:10.1109/LED.2014.2304673 |
| Access Level: | acceso abierto |
| Palabra clave: | Characterization CMOS Noise Parameter extraction Random telegraph signals |
| Sumario: | A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant. © 1980-2012 IEEE. |
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