A portable low-cost SEU evaluation board for SRAMs

This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the test...

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Detalles Bibliográficos
Autores: Franco Peláez, Francisco Javier, Velazco, Raoul
Tipo de recurso: capítulo de libro
Fecha de publicación:2007
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/53413
Acceso en línea:https://hdl.handle.net/20.500.14352/53413
Access Level:acceso abierto
Palabra clave:537.8
SRAM chips
Logic testing
Radiation effects
Sensitivity
SEU evaluation board
SRAM
Cosmic ray interaction
Field test system
Natural radiation effects
Single event upset
Atmosphere
Cosmic rays
Field programmable gate arrays
Laboratories
Microprocessors
Neutrons
Performance evaluation
Random access memory
System testing
SRAMs
Single event effects
Soft error rate
Electrónica (Física)
Radiactividad
Circuitos integrados
2203.07 Circuitos Integrados
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oai_identifier_str oai:docta.ucm.es:20.500.14352/53413
network_acronym_str ES
network_name_str España
repository_id_str
spelling A portable low-cost SEU evaluation board for SRAMsFranco Peláez, Francisco JavierVelazco, Raoul537.8SRAM chipsLogic testingRadiation effectsSensitivitySEU evaluation boardSRAMCosmic ray interactionField test systemNatural radiation effectsSingle event upsetAtmosphereCosmic raysField programmable gate arraysLaboratoriesMicroprocessorsNeutronsPerformance evaluationRandom access memorySystem testingSRAMsSingle event effectsSoft error rateElectrónica (Física)RadiactividadCircuitos integrados2203.07 Circuitos IntegradosThis paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.IEEE-Inst Electrical Electronics Engineers IncUniversidad Complutense de Madrid20072007-01-3120072007-01-31book parthttp://purl.org/coar/resource_type/c_3248info:eu-repo/semantics/bookPartapplication/pdfhttps://hdl.handle.net/20.500.14352/53413reponame:Docta Complutenseinstname:Universidad Complutense de Madrid (UCM)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:docta.ucm.es:20.500.14352/534132026-06-02T12:44:21Z
dc.title.none.fl_str_mv A portable low-cost SEU evaluation board for SRAMs
title A portable low-cost SEU evaluation board for SRAMs
spellingShingle A portable low-cost SEU evaluation board for SRAMs
Franco Peláez, Francisco Javier
537.8
SRAM chips
Logic testing
Radiation effects
Sensitivity
SEU evaluation board
SRAM
Cosmic ray interaction
Field test system
Natural radiation effects
Single event upset
Atmosphere
Cosmic rays
Field programmable gate arrays
Laboratories
Microprocessors
Neutrons
Performance evaluation
Random access memory
System testing
SRAMs
Single event effects
Soft error rate
Electrónica (Física)
Radiactividad
Circuitos integrados
2203.07 Circuitos Integrados
title_short A portable low-cost SEU evaluation board for SRAMs
title_full A portable low-cost SEU evaluation board for SRAMs
title_fullStr A portable low-cost SEU evaluation board for SRAMs
title_full_unstemmed A portable low-cost SEU evaluation board for SRAMs
title_sort A portable low-cost SEU evaluation board for SRAMs
dc.creator.none.fl_str_mv Franco Peláez, Francisco Javier
Velazco, Raoul
author Franco Peláez, Francisco Javier
author_facet Franco Peláez, Francisco Javier
Velazco, Raoul
author_role author
author2 Velazco, Raoul
author2_role author
dc.contributor.none.fl_str_mv Universidad Complutense de Madrid
dc.subject.none.fl_str_mv 537.8
SRAM chips
Logic testing
Radiation effects
Sensitivity
SEU evaluation board
SRAM
Cosmic ray interaction
Field test system
Natural radiation effects
Single event upset
Atmosphere
Cosmic rays
Field programmable gate arrays
Laboratories
Microprocessors
Neutrons
Performance evaluation
Random access memory
System testing
SRAMs
Single event effects
Soft error rate
Electrónica (Física)
Radiactividad
Circuitos integrados
2203.07 Circuitos Integrados
topic 537.8
SRAM chips
Logic testing
Radiation effects
Sensitivity
SEU evaluation board
SRAM
Cosmic ray interaction
Field test system
Natural radiation effects
Single event upset
Atmosphere
Cosmic rays
Field programmable gate arrays
Laboratories
Microprocessors
Neutrons
Performance evaluation
Random access memory
System testing
SRAMs
Single event effects
Soft error rate
Electrónica (Física)
Radiactividad
Circuitos integrados
2203.07 Circuitos Integrados
description This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.
publishDate 2007
dc.date.none.fl_str_mv 2007
2007-01-31
2007
2007-01-31
dc.type.none.fl_str_mv book part
http://purl.org/coar/resource_type/c_3248
dc.type.openaire.fl_str_mv info:eu-repo/semantics/bookPart
format bookPart
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.14352/53413
url https://hdl.handle.net/20.500.14352/53413
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv IEEE-Inst Electrical Electronics Engineers Inc
publisher.none.fl_str_mv IEEE-Inst Electrical Electronics Engineers Inc
dc.source.none.fl_str_mv reponame:Docta Complutense
instname:Universidad Complutense de Madrid (UCM)
instname_str Universidad Complutense de Madrid (UCM)
reponame_str Docta Complutense
collection Docta Complutense
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869413227544182784
score 15,300724

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