A portable low-cost SEU evaluation board for SRAMs
This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the test...
| Autores: | , |
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| Tipo de recurso: | capítulo de libro |
| Fecha de publicación: | 2007 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/53413 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/53413 |
| Access Level: | acceso abierto |
| Palabra clave: | 537.8 SRAM chips Logic testing Radiation effects Sensitivity SEU evaluation board SRAM Cosmic ray interaction Field test system Natural radiation effects Single event upset Atmosphere Cosmic rays Field programmable gate arrays Laboratories Microprocessors Neutrons Performance evaluation Random access memory System testing SRAMs Single event effects Soft error rate Electrónica (Física) Radiactividad Circuitos integrados 2203.07 Circuitos Integrados |
| Sumario: | This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible. |
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