Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy

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Detalhes bibliográficos
Autor: Gómez Moñivas, Sacha
Tipo de documento: artigo
Data de publicação:2013
País:España
Recursos:Universidad Autónoma de Madrid
Repositório:Biblos-e Archivo. Repositorio Institucional de la UAM
Idioma:inglês
OAI Identifier:oai:repositorio.uam.es:10486/665558
Acesso em linha:http://hdl.handle.net/10486/665558
https://dx.doi.org/10.1109/TNANO.2012.2235081
Access Level:Acceso aberto
Palavra-chave:Electrostatic force microscopy
Thin films
Informática
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spelling Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopyGómez Moñivas, SachaElectrostatic force microscopyThin filmsInformáticaPersonal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. G. M. Sacha, "Influence of the Substrate and Tip Shape on the Characterization of Thin Films by Electrostatic Force Microscopy", IEEE Transactions on Nanotechnology, vol.12, no.2, pp.152-156, Marzo 2013.Electrostatic force microscopy has been shown to be a useful tool to determine the dielectric constant of nanoscaled thin films that play a key role in many electrical, optical and biological phenomena. Previous approaches have made use of simple analytical models to analyze the experimental data for these materials. Here we show that the electrostatic force shows a completely different behavior when the shape of the tip and sample are taken into account. We present a complete study of the interaction between the whole tip and the layers below the thin film. We demonstrate that physical magnitudes such as the surface charge density distribution and the size of the materials have a strong influence on the EFM signal. The EFM sensitivity to the substrate below the thin film decreases with the substrate thickness and saturates for thicknesses above two times the length of the tip, when it is close to that of an infinite medium.Author acknowledges interesting discussion from J. J. Sáenz, C. Gómez-Navarro, J. Gómez-Herrero and E. Castellano-Hernández. This work was supported by TIN2010- 19607. Author acknowledges support from the Spanish Ramón y Cajal Program.IEEEDepartamento de Ingeniería InformáticaEscuela Politécnica SuperiorNeurocomputación Biológica (ING EPS-005)20132013-03-19research articlehttp://purl.org/coar/resource_type/c_2df8fbb1AMhttp://purl.org/coar/version/c_ab4af688f83e57aainfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10486/665558https://dx.doi.org/10.1109/TNANO.2012.2235081reponame:Biblos-e Archivo. Repositorio Institucional de la UAMinstname:Universidad Autónoma de MadridInglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:repositorio.uam.es:10486/6655582026-06-23T12:46:27Z
dc.title.none.fl_str_mv Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
title Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
spellingShingle Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
Gómez Moñivas, Sacha
Electrostatic force microscopy
Thin films
Informática
title_short Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
title_full Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
title_fullStr Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
title_full_unstemmed Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
title_sort Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
dc.creator.none.fl_str_mv Gómez Moñivas, Sacha
author Gómez Moñivas, Sacha
author_facet Gómez Moñivas, Sacha
author_role author
dc.contributor.none.fl_str_mv Departamento de Ingeniería Informática
Escuela Politécnica Superior
Neurocomputación Biológica (ING EPS-005)
dc.subject.none.fl_str_mv Electrostatic force microscopy
Thin films
Informática
topic Electrostatic force microscopy
Thin films
Informática
description Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. G. M. Sacha, "Influence of the Substrate and Tip Shape on the Characterization of Thin Films by Electrostatic Force Microscopy", IEEE Transactions on Nanotechnology, vol.12, no.2, pp.152-156, Marzo 2013.
publishDate 2013
dc.date.none.fl_str_mv 2013
2013-03-19
dc.type.none.fl_str_mv research article
http://purl.org/coar/resource_type/c_2df8fbb1
AM
http://purl.org/coar/version/c_ab4af688f83e57aa
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10486/665558
https://dx.doi.org/10.1109/TNANO.2012.2235081
url http://hdl.handle.net/10486/665558
https://dx.doi.org/10.1109/TNANO.2012.2235081
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv IEEE
publisher.none.fl_str_mv IEEE
dc.source.none.fl_str_mv reponame:Biblos-e Archivo. Repositorio Institucional de la UAM
instname:Universidad Autónoma de Madrid
instname_str Universidad Autónoma de Madrid
reponame_str Biblos-e Archivo. Repositorio Institucional de la UAM
collection Biblos-e Archivo. Repositorio Institucional de la UAM
repository.name.fl_str_mv
repository.mail.fl_str_mv
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