Nanostructured MnGa films on Si/SiO2 with 20.5 kOe room temperature coercivity

Nanostructured Mn67Ga33 films exhibiting high room temperature coercivity (HC = 20.5 kOe) have been prepared by sputtering onto thermally oxidized Si substrates. Both the morphology and the coercivity of the films can be tuned by varying the growth parameters. The low deposition rate film, sputtered...

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Detalles Bibliográficos
Autores: Zha, Chaolin, Dumas, Randy K., Lau, J. W., Mohseni, S. M., Sani, Sohrab R., Golosovsky, I. V., Monsen, A. F., Nogués, Josep|||0000-0003-4616-1371, Åkerman, Johan
Tipo de recurso: artículo
Fecha de publicación:2011
País:España
Institución:Universitat Autònoma de Barcelona
Repositorio:Dipòsit Digital de Documents de la UAB
Idioma:inglés
OAI Identifier:oai:ddd.uab.cat:107331
Acceso en línea:https://ddd.uab.cat/record/107331
https://dx.doi.org/urn:doi:10.1063/1.3656457
Access Level:acceso abierto
Palabra clave:Materials
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Sumario:Nanostructured Mn67Ga33 films exhibiting high room temperature coercivity (HC = 20.5 kOe) have been prepared by sputtering onto thermally oxidized Si substrates. Both the morphology and the coercivity of the films can be tuned by varying the growth parameters. The low deposition rate film, sputtered at a reduced power and working pressure, demonstrates a discontinuous island-like growth and the highest HC. The large HC is linked to the presence of the high anisotropy DO22 Mn3Ga phase and the single domain character of the exchange isolated, dipolar interacting, single crystal islands.