Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation

Producción Científica

Bibliographic Details
Authors: Santos Tejido, Iván, Ruiz Prieto, Manuel, Aboy Cebrián, María, Marqués Cuesta, Luis Alberto, López Martín, Pedro, Pelaz Montes, María Lourdes
Format: article
Publication Date:2018
Country:España
Institution:Universidad de Valladolid
Repository:UVaDOC. Repositorio Documental de la Universidad de Valladolid
OAI Identifier:oai:uvadoc.uva.es:10324/30982
Online Access:https://doi.org/10.1007/s11664-018-6140-x
http://uvadoc.uva.es/handle/10324/30982
Access Level:Open access
Keyword:Silicio cristalino
Microscopia electrónica
Crystalline silicon
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spelling Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image SimulationSantos Tejido, IvánRuiz Prieto, ManuelAboy Cebrián, MaríaMarqués Cuesta, Luis AlbertoLópez Martín, PedroPelaz Montes, María LourdesSilicio cristalinoMicroscopia electrónicaCrystalline siliconProducción CientíficaWe used atomistic simulation tools to correlate experimental transmission electron microscopy images of extended defects in crystalline silicon with their structures at an atomic level. Reliable atomic configurations of extended defects were generated using classical molecular dynamics simulations. Simulated high-resolution transmission electron microscopy (HRTEM) images of obtained defects were compared to experimental images reported in the literature. We validated the developed procedure with the configurations proposed in the literature for {113} and {111} rod-like defects. We also proposed from our procedure configurations for {111} and {001} dislocation loops with simulated HRTEM images in excellent agreement with experimental images.Ministerio de Ciencia e Innovación (Proyect TEC2014-60694-P)Junta de Castilla y León (programa de apoyo a proyectos de investigación - Ref. VA331U14)Springer2018info:eu-repo/semantics/articleapplication/pdfhttps://doi.org/10.1007/s11664-018-6140-xhttp://uvadoc.uva.es/handle/10324/30982reponame:UVaDOC. Repositorio Documental de la Universidad de Valladolidinstname:Universidad de ValladolidIngléshttps://link.springer.com/article/10.1007/s11664-018-6140-xinfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/4.0/oai:uvadoc.uva.es:10324/309822026-06-13T12:44:47Z
dc.title.none.fl_str_mv Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
title Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
spellingShingle Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
Santos Tejido, Iván
Silicio cristalino
Microscopia electrónica
Crystalline silicon
title_short Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
title_full Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
title_fullStr Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
title_full_unstemmed Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
title_sort Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
dc.creator.none.fl_str_mv Santos Tejido, Iván
Ruiz Prieto, Manuel
Aboy Cebrián, María
Marqués Cuesta, Luis Alberto
López Martín, Pedro
Pelaz Montes, María Lourdes
author Santos Tejido, Iván
author_facet Santos Tejido, Iván
Ruiz Prieto, Manuel
Aboy Cebrián, María
Marqués Cuesta, Luis Alberto
López Martín, Pedro
Pelaz Montes, María Lourdes
author_role author
author2 Ruiz Prieto, Manuel
Aboy Cebrián, María
Marqués Cuesta, Luis Alberto
López Martín, Pedro
Pelaz Montes, María Lourdes
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Silicio cristalino
Microscopia electrónica
Crystalline silicon
topic Silicio cristalino
Microscopia electrónica
Crystalline silicon
description Producción Científica
publishDate 2018
dc.date.none.fl_str_mv 2018
dc.type.none.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://doi.org/10.1007/s11664-018-6140-x
http://uvadoc.uva.es/handle/10324/30982
url https://doi.org/10.1007/s11664-018-6140-x
http://uvadoc.uva.es/handle/10324/30982
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv https://link.springer.com/article/10.1007/s11664-018-6140-x
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0/
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Springer
publisher.none.fl_str_mv Springer
dc.source.none.fl_str_mv reponame:UVaDOC. Repositorio Documental de la Universidad de Valladolid
instname:Universidad de Valladolid
instname_str Universidad de Valladolid
reponame_str UVaDOC. Repositorio Documental de la Universidad de Valladolid
collection UVaDOC. Repositorio Documental de la Universidad de Valladolid
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,301603

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