Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
Producción Científica
| Authors: | , , , , , |
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| Format: | article |
| Publication Date: | 2018 |
| Country: | España |
| Institution: | Universidad de Valladolid |
| Repository: | UVaDOC. Repositorio Documental de la Universidad de Valladolid |
| OAI Identifier: | oai:uvadoc.uva.es:10324/30982 |
| Online Access: | https://doi.org/10.1007/s11664-018-6140-x http://uvadoc.uva.es/handle/10324/30982 |
| Access Level: | Open access |
| Keyword: | Silicio cristalino Microscopia electrónica Crystalline silicon |
| Summary: | Producción Científica |
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