Cita APA

Santos Tejido, I., Ruiz Prieto, M., Aboy Cebrián, M., Marqués Cuesta, L. A., López Martín, P., & Pelaz Montes, M. L. (2018). Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation.

Citación estilo Chicago

Santos Tejido, Iván, Manuel Ruiz Prieto, María Aboy Cebrián, Luis Alberto Marqués Cuesta, Pedro López Martín, y María Lourdes Pelaz Montes. Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation. 2018.

Cita MLA

Santos Tejido, Iván, et al. Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation. 2018.