X-ray absorption spectroscopy and X-ray diffraction analysis of crystalline CoTi2 grown by DC co-sputtering: A theoretical and experimental comparison
A series of thin films were grown at 500 ◦C with a Co and Ti base on silico substrate oriented at (4 0 0) by means of the DC co-sputtering technique. For 7 and 11% Co concentrations, 50, 80, and 110W were used. CoTi2 structure was simulated with the FEFF routine of the WinXAS program. XAS analyses w...
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| Formato: | artículo |
| Estado: | Versión enviada para evaluación y publicación |
| Fecha de publicación: | 2009 |
| País: | México |
| Recursos: | Centro de Investigación en Materiales Avanzados |
| Repositorio: | Fuente de Objetos Científicos Open Access del CIMAV |
| Idioma: | inglés |
| OAI Identifier: | oai:cimav.repositorioinstitucional.mx:1004/972 |
| Acesso em linha: | http://cimav.repositorioinstitucional.mx/jspui/handle/1004/972 |
| Access Level: | acceso abierto |
| Palavra-chave: | info:eu-repo/classification/CoTi2/X-Ray info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2299 info:eu-repo/classification/cti/229999 |
| Resumo: | A series of thin films were grown at 500 ◦C with a Co and Ti base on silico substrate oriented at (4 0 0) by means of the DC co-sputtering technique. For 7 and 11% Co concentrations, 50, 80, and 110W were used. CoTi2 structure was simulated with the FEFF routine of the WinXAS program. XAS analyses were also performed in order to compare simulated results with experimental results. The X-ray diffraction and atomic absorption results reveal a CoTi2 (Fd-3ms) and Ti (P63/mmc) phase, while extended X-ray absorption fine structure spectroscopy shows slight variations in the coordination numbers and distances from close neighbors and have 0–7% deviations. The results showed good agreement between the theoretical and experimental results. |
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