Photoluminescence study of AlGaAs/GaAs quantum wells grown by molecular beam epitaxy with in-situ / ex–situ growth interruptions

The specific properties of quantum wells (QWs) grown by molecular beam epitaxy (MBE) are directly affected by severalaspects, such as non-intentional incorporated impurities, alloy disorder, interface roughness, etc. These aspects stronglydepend on the particular process used during the MBE growth....

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Detalles Bibliográficos
Autores: M. López López, P. Acosta Díaz, O. Cano Aguilar, F.L. Castillo Alvarado, M. Meléndez Lira
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2001
País:México
Institución:Instituto Politécnico Nacional
Repositorio:Redalyc-IPN
OAI Identifier:oai:redalyc.org:94201209
Acceso en línea:https://www.redalyc.org/articulo.oa?id=94201209
Access Level:acceso abierto
Palabra clave:Física, Astronomía y Matemáticas
in
Quantum wells
situ processing
growth interruption
molecular beam epitaxy
Descripción
Sumario:The specific properties of quantum wells (QWs) grown by molecular beam epitaxy (MBE) are directly affected by severalaspects, such as non-intentional incorporated impurities, alloy disorder, interface roughness, etc. These aspects stronglydepend on the particular process used during the MBE growth. In this work, we present results of a photoluminescencespectroscopy (PL) study of AlxGa1-x As / GaAs QWs grown by MBE on GaAs buffer layers which were processed by exsituor in -situ growth interruptions. The QWs exhibit drastic c hanges in their PL spectra depending on the type ofinterruption process performed on the GaAs buffer layer surface. Roughness at the QWs interfaces has been calculatedand correlated with the growth interruption process