Medición de frecuencias de vibración de objetos utilizando el efecto de fuerza foto-electro-motriz
Two phase-modulated interference patterns incident on a BSO sample create two photo-EMF signals. The patternsinterfere constructively only when the modulation frequency of both patterns is equal. Potential use for determination ofvibration frequency of objetcs and as a selective filter in communicat...
| Authors: | , |
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| Format: | article |
| Status: | Published version |
| Publication Date: | 2003 |
| Country: | México |
| Institution: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repository: | Redalyc-INAOE |
| OAI Identifier: | oai:redalyc.org:94216209 |
| Online Access: | https://www.redalyc.org/articulo.oa?id=94216209 |
| Access Level: | Open access |
| Keyword: | Física, Astronomía y Matemáticas EMF Efecto photo Semiconductores Interferometro adaptivo Vibrometro fotorrefractivos |
| Summary: | Two phase-modulated interference patterns incident on a BSO sample create two photo-EMF signals. The patternsinterfere constructively only when the modulation frequency of both patterns is equal. Potential use for determination ofvibration frequency of objetcs and as a selective filter in communications is discussed |
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