Medición de frecuencias de vibración de objetos utilizando el efecto de fuerza foto-electro-motriz
Two phase-modulated interference patterns incident on a BSO sample create two photo-EMF signals. The patternsinterfere constructively only when the modulation frequency of both patterns is equal. Potential use for determination ofvibration frequency of objetcs and as a selective filter in communicat...
| Autores: | , |
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| Formato: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2003 |
| País: | México |
| Recursos: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Redalyc-INAOE |
| OAI Identifier: | oai:redalyc.org:94216209 |
| Acesso em linha: | https://www.redalyc.org/articulo.oa?id=94216209 |
| Access Level: | acceso abierto |
| Palavra-chave: | Física, Astronomía y Matemáticas EMF Efecto photo Semiconductores Interferometro adaptivo Vibrometro fotorrefractivos |
| Resumo: | Two phase-modulated interference patterns incident on a BSO sample create two photo-EMF signals. The patternsinterfere constructively only when the modulation frequency of both patterns is equal. Potential use for determination ofvibration frequency of objetcs and as a selective filter in communications is discussed |
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