Symbolic analysis of analog circuits containing voltage mirrors and current mirrors
The pathological elements voltage mirror (VM) and current mirror (CM) have shown advantages in analog behavioral modeling and circuit synthesis, where many nullor-mirror equivalences have been explored to design and to transform voltage-mode circuits to current-mode ones and viceversa. However, both...
| Autores: | , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2010 |
| País: | México |
| Institución: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Repositorio Institucional del INAOE |
| Idioma: | inglés |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/1514 |
| Acceso en línea: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1514 |
| Access Level: | acceso abierto |
| Palabra clave: | info:eu-repo/classification/Nullor/Nullor info:eu-repo/classification/Voltage mirror/Voltage mirror info:eu-repo/classification/Current mirror/Current mirror info:eu-repo/classification/Symbolic analysis/Symbolic analysis info:eu-repo/classification/Nodal analysis/Nodal analysis info:eu-repo/classification/Active filter/Active filter info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 |
| Sumario: | The pathological elements voltage mirror (VM) and current mirror (CM) have shown advantages in analog behavioral modeling and circuit synthesis, where many nullor-mirror equivalences have been explored to design and to transform voltage-mode circuits to current-mode ones and viceversa. However, both the VM and CM have not equivalents to perform automatic symbolic circuit analysis. In this manner, we introduce nullor-equivalents for these pathological elements allowing to include parasitics and to perform only symbolic nodal analysis. The nullor-equivalent of the CM is extended to provide multiple- outpus (MO-CM). Finally, two active filters containing VMs, CMs and MO-CMs are analysed to show the usefulness of the models. |
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