Symbolic analysis of analog circuits containing voltage mirrors and current mirrors

The pathological elements voltage mirror (VM) and current mirror (CM) have shown advantages in analog behavioral modeling and circuit synthesis, where many nullor-mirror equivalences have been explored to design and to transform voltage-mode circuits to current-mode ones and viceversa. However, both...

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Detalhes bibliográficos
Autores: ESTEBAN TLELO CUAUTLE, CARLOS SANCHEZ LOPEZ
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2010
País:México
Recursos:Instituto Nacional de Astrofísica, Óptica y Electrónica
Repositorio:Repositorio Institucional del INAOE
Idioma:inglés
OAI Identifier:oai:inaoe.repositorioinstitucional.mx:1009/1514
Acesso em linha:http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1514
Access Level:acceso abierto
Palavra-chave:info:eu-repo/classification/Nullor/Nullor
info:eu-repo/classification/Voltage mirror/Voltage mirror
info:eu-repo/classification/Current mirror/Current mirror
info:eu-repo/classification/Symbolic analysis/Symbolic analysis
info:eu-repo/classification/Nodal analysis/Nodal analysis
info:eu-repo/classification/Active filter/Active filter
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2203
Descrição
Resumo:The pathological elements voltage mirror (VM) and current mirror (CM) have shown advantages in analog behavioral modeling and circuit synthesis, where many nullor-mirror equivalences have been explored to design and to transform voltage-mode circuits to current-mode ones and viceversa. However, both the VM and CM have not equivalents to perform automatic symbolic circuit analysis. In this manner, we introduce nullor-equivalents for these pathological elements allowing to include parasitics and to perform only symbolic nodal analysis. The nullor-equivalent of the CM is extended to provide multiple- outpus (MO-CM). Finally, two active filters containing VMs, CMs and MO-CMs are analysed to show the usefulness of the models.