Thermoreflectance studies in CdNiTe nanocrystalline films
CdNiTe ternary semiconductor thin films were deposited using the cathodic erosion by radiofrequency technique (r.f. sputtering), on 7059 Corning glass substrates. Cd1-xNixTe targets with different Ni compositions in the range 0 < x < 0. 15 were used. Structural analysis in these samples using...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2003 |
| País: | México |
| Institución: | Universidad Nacional Autónoma de México |
| Repositorio: | Sistema de Información de la Facultad de Ciencias, UNAM |
| OAI Identifier: | oai:repositorio.fciencias.unam.mx:11154/1774 |
| Acceso en línea: | http://hdl.handle.net/11154/1774 |
| Access Level: | acceso abierto |
| Palabra clave: | Chemistry, Multidisciplinary Physics, Condensed Matter semiconductors thin films optical properties |
| Sumario: | CdNiTe ternary semiconductor thin films were deposited using the cathodic erosion by radiofrequency technique (r.f. sputtering), on 7059 Corning glass substrates. Cd1-xNixTe targets with different Ni compositions in the range 0 < x < 0. 15 were used. Structural analysis in these samples using SEM and X-ray diffraction have shown that films are polycrystalline with grain sizes between 26 and 35 nm |
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