A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2

The aim of this report is to describe a novel method to detect resistive opens or shorts in long interconnects, specifically in buses. It consists in introducing feedback in these interconnects and force them to oscillate. As we will see later, the frequency of oscillation is very sensitive to the p...

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Detalhes bibliográficos
Autores: Rius Vázquez, José, Maqueda Castellote, Pablo
Formato: informe técnico
Fecha de publicación:2016
País:España
Recursos:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/441858
Acesso em linha:https://hdl.handle.net/2117/441858
Access Level:acceso abierto
Palavra-chave:Electronics engineering
Short circuits
Oscillation
Interconnects
Defect detection
Àrees temàtiques de la UPC::Enginyeria electrònica
Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
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spelling A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2Rius Vázquez, JoséMaqueda Castellote, PabloElectronics engineeringShort circuitsOscillationInterconnectsDefect detectionÀrees temàtiques de la UPC::Enginyeria electrònicaÀrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potènciaThe aim of this report is to describe a novel method to detect resistive opens or shorts in long interconnects, specifically in buses. It consists in introducing feedback in these interconnects and force them to oscillate. As we will see later, the frequency of oscillation is very sensitive to the presence of such defects, thus opening the possibility to detect them by comparing such frequency with a reference. Also, we will show two specific phenomena related to the testing of these structures: the first is that the place where the defect is located in the long interconnect plays a role in the variation of frequency; the second is that the coupling between the interconnects, in the case of buses produce, in certain conditions, an increase instead of a decrease in the oscillation frequency.The aim of this report is to describe a novel method to detect resistive opens or shorts in long interconnects, specifically in buses. It consists in introducing feedback in these interconnects and force them to oscillate. As we will see later, the frequency of oscillation is very sensitive to the presence of such defects, thus opening the possibility to detect them by comparing such frequency with a reference. Also, we will show two specific phenomena related to the testing of these structures: the first is that the place where the defect is located in the long interconnect plays a role in the variation of frequency; the second is that the coupling between the interconnects, in the case of buses produce, in certain conditions, an increase instead of a decrease in the oscillation frequency.20162016-12-0120252025-09-17reporthttp://purl.org/coar/resource_type/c_93fcAOhttp://purl.org/coar/version/c_b1a7d7d4d402bcceinfo:eu-repo/semantics/reportapplication/pdfhttps://hdl.handle.net/2117/441858reponame:UPCommons. Portal del coneixement obert de la UPCinstname:Universitat Politècnica de Catalunya (UPC)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:upcommons.upc.edu:2117/4418582026-05-27T15:37:01Z
dc.title.none.fl_str_mv A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
title A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
spellingShingle A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
Rius Vázquez, José
Electronics engineering
Short circuits
Oscillation
Interconnects
Defect detection
Àrees temàtiques de la UPC::Enginyeria electrònica
Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
title_short A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
title_full A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
title_fullStr A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
title_full_unstemmed A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
title_sort A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
dc.creator.none.fl_str_mv Rius Vázquez, José
Maqueda Castellote, Pablo
author Rius Vázquez, José
author_facet Rius Vázquez, José
Maqueda Castellote, Pablo
author_role author
author2 Maqueda Castellote, Pablo
author2_role author
dc.subject.none.fl_str_mv Electronics engineering
Short circuits
Oscillation
Interconnects
Defect detection
Àrees temàtiques de la UPC::Enginyeria electrònica
Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
topic Electronics engineering
Short circuits
Oscillation
Interconnects
Defect detection
Àrees temàtiques de la UPC::Enginyeria electrònica
Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
description The aim of this report is to describe a novel method to detect resistive opens or shorts in long interconnects, specifically in buses. It consists in introducing feedback in these interconnects and force them to oscillate. As we will see later, the frequency of oscillation is very sensitive to the presence of such defects, thus opening the possibility to detect them by comparing such frequency with a reference. Also, we will show two specific phenomena related to the testing of these structures: the first is that the place where the defect is located in the long interconnect plays a role in the variation of frequency; the second is that the coupling between the interconnects, in the case of buses produce, in certain conditions, an increase instead of a decrease in the oscillation frequency.
publishDate 2016
dc.date.none.fl_str_mv 2016
2016-12-01
2025
2025-09-17
dc.type.none.fl_str_mv report
http://purl.org/coar/resource_type/c_93fc
AO
http://purl.org/coar/version/c_b1a7d7d4d402bcce
dc.type.openaire.fl_str_mv info:eu-repo/semantics/report
format report
dc.identifier.none.fl_str_mv https://hdl.handle.net/2117/441858
url https://hdl.handle.net/2117/441858
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:UPCommons. Portal del coneixement obert de la UPC
instname:Universitat Politècnica de Catalunya (UPC)
instname_str Universitat Politècnica de Catalunya (UPC)
reponame_str UPCommons. Portal del coneixement obert de la UPC
collection UPCommons. Portal del coneixement obert de la UPC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,811543

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