A method to detect resistive opens/shorts in long interconnect: theory and interconnects. Appendix 4: mathematical analysis of shorts in coupled interconnects. Versió 2
The aim of this report is to describe a novel method to detect resistive opens or shorts in long interconnects, specifically in buses. It consists in introducing feedback in these interconnects and force them to oscillate. As we will see later, the frequency of oscillation is very sensitive to the p...
| Autores: | , |
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| Tipo de recurso: | informe técnico |
| Fecha de publicación: | 2016 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/441858 |
| Acceso en línea: | https://hdl.handle.net/2117/441858 |
| Access Level: | acceso abierto |
| Palabra clave: | Electronics engineering Short circuits Oscillation Interconnects Defect detection Àrees temàtiques de la UPC::Enginyeria electrònica Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència |
| Sumario: | The aim of this report is to describe a novel method to detect resistive opens or shorts in long interconnects, specifically in buses. It consists in introducing feedback in these interconnects and force them to oscillate. As we will see later, the frequency of oscillation is very sensitive to the presence of such defects, thus opening the possibility to detect them by comparing such frequency with a reference. Also, we will show two specific phenomena related to the testing of these structures: the first is that the place where the defect is located in the long interconnect plays a role in the variation of frequency; the second is that the coupling between the interconnects, in the case of buses produce, in certain conditions, an increase instead of a decrease in the oscillation frequency. |
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