Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers

4 pages, 6 figures.

Detalles Bibliográficos
Autores: Sics, Igors, Nogales, Aurora, Ezquerra, Tiberio A., Denchev, Zlatan, Baltá Calleja, Francisco José, Meyer, A., Döhrmann, R.
Tipo de recurso: artículo
Fecha de publicación:2000
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/21098
Acceso en línea:http://hdl.handle.net/10261/21098
Access Level:acceso abierto
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spelling Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymersSics, IgorsNogales, AuroraEzquerra, Tiberio A.Denchev, ZlatanBaltá Calleja, Francisco JoséMeyer, A.Döhrmann, R.4 pages, 6 figures.A novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystallization. This technique includes simultaneous measurements of small angle-wide angle x-ray scattering and dielectric spectroscopy (SWD). The capabilities of the technique have been probed by following in real time the crystallization process of a model crystallizable polymer: poly(ethylene terephthalate). By performing these experiments, simultaneous information from both, the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science.The authors are indebted to the DGICYT (Grant No. PB 94-0049) and to Comunidad de Madrid (07N/0063/1998), Spain, for generous support of this investigation. I. S. thanks a AECI (Spain) for the tenure of a fellowship. A. N. thanks the support from the FPI program of the Spanish Ministry of Science and Culture (MEC). Z.D. thanks MEC for the tenure of a fellowship of the program ‘‘Científicos y Tecnólogos Extranjeros.’’ The experiments at HASYLAB (Hamburg, Germany) have been funded by the program Human Capital and Mobility, Access to large Installations EC (ERBFMGEDT 950059).Peer reviewedAmerican Institute of Physics201020102000info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_650197931 bytesapplication/pdfhttp://hdl.handle.net/10261/21098reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttp://dx.doi.org/10.1063/1.1150528info:eu-repo/semantics/openAccessoai:digital.csic.es:10261/210982026-05-22T06:33:51Z
dc.title.none.fl_str_mv Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
title Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
spellingShingle Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
Sics, Igors
title_short Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
title_full Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
title_fullStr Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
title_full_unstemmed Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
title_sort Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers
dc.creator.none.fl_str_mv Sics, Igors
Nogales, Aurora
Ezquerra, Tiberio A.
Denchev, Zlatan
Baltá Calleja, Francisco José
Meyer, A.
Döhrmann, R.
author Sics, Igors
author_facet Sics, Igors
Nogales, Aurora
Ezquerra, Tiberio A.
Denchev, Zlatan
Baltá Calleja, Francisco José
Meyer, A.
Döhrmann, R.
author_role author
author2 Nogales, Aurora
Ezquerra, Tiberio A.
Denchev, Zlatan
Baltá Calleja, Francisco José
Meyer, A.
Döhrmann, R.
author2_role author
author
author
author
author
author
description 4 pages, 6 figures.
publishDate 2000
dc.date.none.fl_str_mv 2000
2010
2010
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/21098
url http://hdl.handle.net/10261/21098
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv http://dx.doi.org/10.1063/1.1150528
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 97931 bytes
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15.811543

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