Cita APA

Sics, I., Nogales, A., Ezquerra, T. A., Denchev, Z., Baltá Calleja, F. J., Meyer, A., & Döhrmann, R. (2000). Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers.

Citación estilo Chicago

Sics, Igors, Aurora Nogales, Tiberio A. Ezquerra, Zlatan Denchev, Francisco José Baltá Calleja, A. Meyer, y R. Döhrmann. Simultaneous Measurements of Small Angle X-ray Scattering, Wide Angle X-ray Scattering, and Dielectric Spectroscopy During Crystallization of Polymers. 2000.

Cita MLA

Sics, Igors, et al. Simultaneous Measurements of Small Angle X-ray Scattering, Wide Angle X-ray Scattering, and Dielectric Spectroscopy During Crystallization of Polymers. 2000.