Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature

This work is focused on the study of the fine speckle contrast present in planar view observations of matched and mismatched InGaAs layers grown by molecular beam epitaxy on InP substrates. Our results provide experimental evidence of the evolution of this fine structure with the mismatch, layer thi...

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Detalles Bibliográficos
Autores: Peiró Martínez, Francisca, Cornet i Calveras, Albert, Herms Berenguer, Atilà, Morante i Lleonart, Joan Ramon, Clark, S. A., Williams, R. H.
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:1993
País:España
Institución:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Repositorio:Recercat. Dipósit de la Recerca de Catalunya
OAI Identifier:oai:recercat.cat:2445/32222
Acceso en línea:https://hdl.handle.net/2445/32222
Access Level:acceso abierto
Palabra clave:Pel·lícules fines
Feixos moleculars
Nanotecnologia
Thin films
Molecular beams
Nanotechnology
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spelling Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperaturePeiró Martínez, FranciscaCornet i Calveras, AlbertHerms Berenguer, AtilàMorante i Lleonart, Joan RamonClark, S. A.Williams, R. H.Pel·lícules finesFeixos molecularsNanotecnologiaThin filmsMolecular beamsNanotechnologyThis work is focused on the study of the fine speckle contrast present in planar view observations of matched and mismatched InGaAs layers grown by molecular beam epitaxy on InP substrates. Our results provide experimental evidence of the evolution of this fine structure with the mismatch, layer thickness, and growth temperature. The correlation of the influence of all these parameters on the appearance of the contrast modulation points to the development of the fine structure during the growth. Moreover, as growth proceeds, this structure shows a dynamic behavior which depends on the intrinsic layer substrate stress.American Institute of Physics2012201219932012info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersion5 p.application/pdfhttps://hdl.handle.net/2445/32222Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)reponame:Recercat. Dipósit de la Recerca de Catalunyainstname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)InglésReproducció del document publicat a: http://dx.doi.org/10.1063/1.352815Journal of Applied Physics, 1993, vol. 73, num. 9, p. 4319-4323http://dx.doi.org/10.1063/1.352815(c) American Institute of Physics , 1993info:eu-repo/semantics/openAccessoai:recercat.cat:2445/322222026-05-29T05:05:01Z
dc.title.none.fl_str_mv Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
title Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
spellingShingle Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
Peiró Martínez, Francisca
Pel·lícules fines
Feixos moleculars
Nanotecnologia
Thin films
Molecular beams
Nanotechnology
title_short Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
title_full Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
title_fullStr Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
title_full_unstemmed Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
title_sort Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
dc.creator.none.fl_str_mv Peiró Martínez, Francisca
Cornet i Calveras, Albert
Herms Berenguer, Atilà
Morante i Lleonart, Joan Ramon
Clark, S. A.
Williams, R. H.
author Peiró Martínez, Francisca
author_facet Peiró Martínez, Francisca
Cornet i Calveras, Albert
Herms Berenguer, Atilà
Morante i Lleonart, Joan Ramon
Clark, S. A.
Williams, R. H.
author_role author
author2 Cornet i Calveras, Albert
Herms Berenguer, Atilà
Morante i Lleonart, Joan Ramon
Clark, S. A.
Williams, R. H.
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Pel·lícules fines
Feixos moleculars
Nanotecnologia
Thin films
Molecular beams
Nanotechnology
topic Pel·lícules fines
Feixos moleculars
Nanotecnologia
Thin films
Molecular beams
Nanotechnology
description This work is focused on the study of the fine speckle contrast present in planar view observations of matched and mismatched InGaAs layers grown by molecular beam epitaxy on InP substrates. Our results provide experimental evidence of the evolution of this fine structure with the mismatch, layer thickness, and growth temperature. The correlation of the influence of all these parameters on the appearance of the contrast modulation points to the development of the fine structure during the growth. Moreover, as growth proceeds, this structure shows a dynamic behavior which depends on the intrinsic layer substrate stress.
publishDate 1993
dc.date.none.fl_str_mv 1993
2012
2012
2012
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/32222
url https://hdl.handle.net/2445/32222
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Reproducció del document publicat a: http://dx.doi.org/10.1063/1.352815
Journal of Applied Physics, 1993, vol. 73, num. 9, p. 4319-4323
http://dx.doi.org/10.1063/1.352815
dc.rights.none.fl_str_mv (c) American Institute of Physics , 1993
info:eu-repo/semantics/openAccess
rights_invalid_str_mv (c) American Institute of Physics , 1993
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 5 p.
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
reponame:Recercat. Dipósit de la Recerca de Catalunya
instname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
instname_str Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
reponame_str Recercat. Dipósit de la Recerca de Catalunya
collection Recercat. Dipósit de la Recerca de Catalunya
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15.812429

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