Cita APA

Peiró Martínez, F., Cornet i Calveras, A., Herms Berenguer, A., Morante i Lleonart, J. R., Clark, S. A., & Williams, R. H. (1993). Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature.

Citación estilo Chicago

Peiró Martínez, Francisca, Albert Cornet i Calveras, Atilà Herms Berenguer, Joan Ramon Morante i Lleonart, S. A. Clark, y R. H. Williams. Fine Speckle Contrast in InGaAs/InP Systems: Influence of Layer Thickness, Missmatch, and Growing Temperature. 1993.

Cita MLA

Peiró Martínez, Francisca, et al. Fine Speckle Contrast in InGaAs/InP Systems: Influence of Layer Thickness, Missmatch, and Growing Temperature. 1993.