Submonolayer sensitivity of InSb on InP determined by friction-force microscopy
Using molecular-beam-epitaxy-grown InAs and InSb on InP(001) surfaces, we show that the friction-force microscope is sensitive to monolayer coverage. Those surfaces are characterized by three-dimensional islands separated by flat regions. For a constant load, the frictional forces measured on the In...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 1997 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:dnet:digitalcsic_::42207fc89c613bd20cd2dd31ba176995 |
| Acceso en línea: | http://hdl.handle.net/10261/27406 |
| Access Level: | acceso abierto |
| Palabra clave: | MBE InSb InP AFM |
| Sumario: | Using molecular-beam-epitaxy-grown InAs and InSb on InP(001) surfaces, we show that the friction-force microscope is sensitive to monolayer coverage. Those surfaces are characterized by three-dimensional islands separated by flat regions. For a constant load, the frictional forces measured on the InAs island and on the substrate are the same. This is due to the formation of a two-dimensional wetting layer (1.5 ML) of InAs covering the InP(001). The frictional force is controlled by the interaction of this layer and the tip. In contrast, the deposition of 2 ML of InSb on InP(001) produces a different behavior. The frictional force changes when the tip moves from the island to the flat region. Photoluminescence and atomic-force-microscopy experiments show the formation of an InSb submonolayer. The sensitivity of the friction-force microscope to monolayer coverage illustrates its usefulness for wetting-layer analysis. Based on these results we discuss the potential of the friction-force microscope to develop a spatially resolved friction spectroscopy. |
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