Static and small-signal modeling of radiofrequency hexagonal boron nitride switches

A first modeling approximation of the general performance of radiofrequency (RF) switches based on hexagonal boron nitride (hBN), a two-dimensional (2D) dielectric material is presented. The I-V characteristics intrinsic and extrinsic impedance parameters, the return loss, insertion loss and isolati...

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Detalles Bibliográficos
Autores: Pacheco-Sanchez, Anibal|||0000-0002-0897-0605, Jordan-Garcia, Omar, Ramirez-Garcia, Eloy|||0000-0002-2594-621X, Jiménez, David|||0000-0002-8148-198X
Tipo de recurso: artículo
Fecha de publicación:2023
País:España
Institución:Universitat Autònoma de Barcelona
Repositorio:Dipòsit Digital de Documents de la UAB
Idioma:inglés
OAI Identifier:oai:ddd.uab.cat:321735
Acceso en línea:https://ddd.uab.cat/record/321735
https://dx.doi.org/urn:doi:10.1109/JEDS.2023.3268349
Access Level:acceso abierto
Palabra clave:2D
Hbn
Impedance
Insertion loss
Isolation
Loss measurement
Performance evaluation
Radio frequency
Resistance
Resistive switching
RF switch
Switches
Descripción
Sumario:A first modeling approximation of the general performance of radiofrequency (RF) switches based on hexagonal boron nitride (hBN), a two-dimensional (2D) dielectric material is presented. The I-V characteristics intrinsic and extrinsic impedance parameters, the return loss, insertion loss and isolation of RF 2D switches fabricated with hBN are described here by a equivalent circuit models. Straightforward analytical expressions are obtained. In contrast to conventional switches, the unique RF performance of the hBN switch, at ON-state, i.e., a direct improvement with frequency of the insertion loss, is accurately described by considering a capacitor in the intrinsic part of the model. The latter is suggested to be related to storaged charge during the resistive switching mechanism. The highest mean relative error obtained between modeling and measurements of the return loss is of 7.6% with the approach presented here which overcomes the 42.5% of difference obtained with a previous model with an incomplete intrinsic device description.