Cathodoluminescence from mechanically cracked porous silicon
Cathodoluminescence of porous silicon after mechanical damage with a tip has been studied in the scanning electron microscope. Mechanical damage results in the exposure of new surfaces related to fracture and to small particles appearing over the porous silicon layer. The freshly generated surfaces...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 1999 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/59138 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/59138 |
| Access Level: | acceso abierto |
| Palabra clave: | 538.9 Física de materiales |
| Sumario: | Cathodoluminescence of porous silicon after mechanical damage with a tip has been studied in the scanning electron microscope. Mechanical damage results in the exposure of new surfaces related to fracture and to small particles appearing over the porous silicon layer. The freshly generated surfaces caused an increase of several orders of magnitude in the luminescence efficiency. |
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