Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy
Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
| Autores: | , , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2009 |
| País: | España |
| Institución: | Universidad Autónoma de Madrid |
| Repositorio: | Biblos-e Archivo. Repositorio Institucional de la UAM |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.uam.es:10486/666310 |
| Acceso en línea: | http://hdl.handle.net/10486/666310 https://dx.doi.org/10.1063/1.3149770 |
| Access Level: | acceso abierto |
| Palabra clave: | Charge injection Graphene Thin films Scanning probe microscopes Silicon Informática |
| Sumario: | Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
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