Magnetic scanning probe calibration using graphene hall sensor
Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitativ...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2013 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/94781 |
| Acceso en línea: | http://hdl.handle.net/10261/94781 |
| Access Level: | acceso abierto |
| Palabra clave: | Hall sensor Kelvin probe force microscopy Magnetic probe calibration Epitaxial graphene |
| Sumario: | Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitative measurements. We present a straightforward calibration of B probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined Bprobe ∼ 70 mT and ∼ 76 mT for probes with nominal magnetic moment ∼ 1 × 10-13 and > 3 × 10-13 emu, respectively, at a probe-sample distance of 20 nm. © 2013 IEEE. |
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