Impact of laser attacks on the switching behavior of RRAM devices

The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative to replace current memory technologies. However, their suitability for this...

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Autores: Arumi Delgado, Daniel|||0000-0002-6638-7485, Manich Bou, Salvador|||0000-0001-5265-1209, Gómez Pau, Álvaro|||0000-0002-7774-1662, Rodríguez Montañés, Rosa|||0000-0001-6231-0862, Montilla, Víctor, Hernández, David, Bargalló González, Mireia, Campabadal, Francesca
Tipo de documento: artigo
Data de publicação:2020
País:España
Recursos:Universitat Politècnica de Catalunya (UPC)
Repositório:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglês
OAI Identifier:oai:upcommons.upc.edu:2117/175992
Acesso em linha:https://hdl.handle.net/2117/175992
https://dx.doi.org/10.3390/electronics9010200
Access Level:Acceso aberto
Palavra-chave:RRAM
laser attack
resistive switching
security
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spelling Impact of laser attacks on the switching behavior of RRAM devicesArumi Delgado, Daniel|||0000-0002-6638-7485Manich Bou, Salvador|||0000-0001-5265-1209Gómez Pau, Álvaro|||0000-0002-7774-1662Rodríguez Montañés, Rosa|||0000-0001-6231-0862Montilla, VíctorHernández, DavidBargalló González, MireiaCampabadal, FrancescaRRAMlaser attackresistive switchingsecurityThe ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative to replace current memory technologies. However, their suitability for this kind of application, where the integrity of the data is crucial, is still under study. Among the different typology of attacks to recover information of secret data, laser attack is one of the most common due to its simplicity. Some preliminary works have already addressed the influence of laser tests on RRAM devices. Nevertheless, the results are not conclusive since different responses have been reported depending on the circuit under testing and the features of the test. In this paper, we have conducted laser tests on individual RRAM devices. For the set of experiments conducted, the devices did not show faulty behaviors. These results contribute to the characterization of RRAMs and, together with the rest of related works, are expected to pave the way for the development of suitable countermeasures against external attacks.20202020-01-2020202020-01-29journal articlehttp://purl.org/coar/resource_type/c_6501VoRhttp://purl.org/coar/version/c_970fb48d4fbd8a85info:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/2117/175992https://dx.doi.org/10.3390/electronics9010200reponame:UPCommons. Portal del coneixement obert de la UPCinstname:Universitat Politècnica de Catalunya (UPC)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2Attribution-NonCommercial 3.0 Spainhttp://creativecommons.org/licenses/by-nc/3.0/es/info:eu-repo/semantics/openAccessoai:upcommons.upc.edu:2117/1759922026-05-27T15:37:01Z
dc.title.none.fl_str_mv Impact of laser attacks on the switching behavior of RRAM devices
title Impact of laser attacks on the switching behavior of RRAM devices
spellingShingle Impact of laser attacks on the switching behavior of RRAM devices
Arumi Delgado, Daniel|||0000-0002-6638-7485
RRAM
laser attack
resistive switching
security
title_short Impact of laser attacks on the switching behavior of RRAM devices
title_full Impact of laser attacks on the switching behavior of RRAM devices
title_fullStr Impact of laser attacks on the switching behavior of RRAM devices
title_full_unstemmed Impact of laser attacks on the switching behavior of RRAM devices
title_sort Impact of laser attacks on the switching behavior of RRAM devices
dc.creator.none.fl_str_mv Arumi Delgado, Daniel|||0000-0002-6638-7485
Manich Bou, Salvador|||0000-0001-5265-1209
Gómez Pau, Álvaro|||0000-0002-7774-1662
Rodríguez Montañés, Rosa|||0000-0001-6231-0862
Montilla, Víctor
Hernández, David
Bargalló González, Mireia
Campabadal, Francesca
author Arumi Delgado, Daniel|||0000-0002-6638-7485
author_facet Arumi Delgado, Daniel|||0000-0002-6638-7485
Manich Bou, Salvador|||0000-0001-5265-1209
Gómez Pau, Álvaro|||0000-0002-7774-1662
Rodríguez Montañés, Rosa|||0000-0001-6231-0862
Montilla, Víctor
Hernández, David
Bargalló González, Mireia
Campabadal, Francesca
author_role author
author2 Manich Bou, Salvador|||0000-0001-5265-1209
Gómez Pau, Álvaro|||0000-0002-7774-1662
Rodríguez Montañés, Rosa|||0000-0001-6231-0862
Montilla, Víctor
Hernández, David
Bargalló González, Mireia
Campabadal, Francesca
author2_role author
author
author
author
author
author
author
dc.subject.none.fl_str_mv RRAM
laser attack
resistive switching
security
topic RRAM
laser attack
resistive switching
security
description The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative to replace current memory technologies. However, their suitability for this kind of application, where the integrity of the data is crucial, is still under study. Among the different typology of attacks to recover information of secret data, laser attack is one of the most common due to its simplicity. Some preliminary works have already addressed the influence of laser tests on RRAM devices. Nevertheless, the results are not conclusive since different responses have been reported depending on the circuit under testing and the features of the test. In this paper, we have conducted laser tests on individual RRAM devices. For the set of experiments conducted, the devices did not show faulty behaviors. These results contribute to the characterization of RRAMs and, together with the rest of related works, are expected to pave the way for the development of suitable countermeasures against external attacks.
publishDate 2020
dc.date.none.fl_str_mv 2020
2020-01-20
2020
2020-01-29
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
VoR
http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://hdl.handle.net/2117/175992
https://dx.doi.org/10.3390/electronics9010200
url https://hdl.handle.net/2117/175992
https://dx.doi.org/10.3390/electronics9010200
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
Attribution-NonCommercial 3.0 Spain
http://creativecommons.org/licenses/by-nc/3.0/es/
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
Attribution-NonCommercial 3.0 Spain
http://creativecommons.org/licenses/by-nc/3.0/es/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:UPCommons. Portal del coneixement obert de la UPC
instname:Universitat Politècnica de Catalunya (UPC)
instname_str Universitat Politècnica de Catalunya (UPC)
reponame_str UPCommons. Portal del coneixement obert de la UPC
collection UPCommons. Portal del coneixement obert de la UPC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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