Widefield SERS for High-Throughput Nanoparticle Screening
Surface-enhanced Raman scattering (SERS) imaging is a powerful technology with unprecedent potential for ultrasensitive chemical analysis. Point-by-point scanning and often excessively long spectral acquisition-times hamper the broad exploitation of the full analytical potential of SERS. Here, we in...
| Autores: | , , , , |
|---|---|
| Tipo de recurso: | artículo |
| Fecha de publicación: | 2022 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/361685 |
| Acceso en línea: | https://hdl.handle.net/2117/361685 https://dx.doi.org/10.1002/anie.202200072 |
| Access Level: | acceso abierto |
| Palabra clave: | Raman spectroscopy nanoparticles Espectroscòpia Raman Àrees temàtiques de la UPC::Física |
| Sumario: | Surface-enhanced Raman scattering (SERS) imaging is a powerful technology with unprecedent potential for ultrasensitive chemical analysis. Point-by-point scanning and often excessively long spectral acquisition-times hamper the broad exploitation of the full analytical potential of SERS. Here, we introduce large scale SERS particle screening (LSSPS), a multiplexed widefield screening approach to particle-characterization, which is 500-1000 times faster than typical confocal Raman implementations. Beyond its higher throughput, LSSPS simultaneously quantifies both the sample’s Raman and Rayleigh scattering, allowing for an unprecedented correlation of SERS activity with the particle-size and to directly quantify the fraction of SERS active particles. |
|---|