Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips

Abstract—An electrooptical measurement system for the dc characterization of visible detectors for CMOS-compatible vision chips is presented, which can help designers to characterize these detectors. The measurement system has been designed to be versatile, fast, and easily expandable and used. Two...

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Detalles Bibliográficos
Autores: Roca Moreno, Elisenda, Frutos Rayego, Fabián, Espejo Meana, Servando Carlos, Domínguez Castro, Rafael, Rodríguez Vázquez, Ángel Benito
Tipo de recurso: artículo
Estado:Versión enviada para evaluación y publicación
Fecha de publicación:1998
País:España
Institución:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/30661
Acceso en línea:http://hdl.handle.net/11441/30661
https://doi.org/10.1109/19.744198
Access Level:acceso abierto
Palabra clave:CMOS integrated circuits
Electrooptics measurements
Image sensors
Optical arrays
Photodetectors
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spelling Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chipsRoca Moreno, ElisendaFrutos Rayego, FabiánEspejo Meana, Servando CarlosDomínguez Castro, RafaelRodríguez Vázquez, Ángel BenitoCMOS integrated circuitsElectrooptics measurementsImage sensorsOptical arraysPhotodetectorsAbstract—An electrooptical measurement system for the dc characterization of visible detectors for CMOS-compatible vision chips is presented, which can help designers to characterize these detectors. The measurement system has been designed to be versatile, fast, and easily expandable and used. Two different setups for the measurement of the spectral response and the optical dynamic range of the detectors are described in detail. Measurements of the spectral response are done with a fully computer-controlled setup, avoiding tedious and inaccurate measurements. A description of the different detectors available in a CMOS process is also given, together with the parameters affecting their response and a set of test structures which can be useful for the characterization of the detectors.IEEEFísica Aplicada IElectrónica y Electromagnetismo1998info:eu-repo/semantics/articleinfo:eu-repo/semantics/submittedVersionapplication/pdfapplication/pdfhttp://hdl.handle.net/11441/30661https://doi.org/10.1109/19.744198reponame:idUS. Depósito de Investigación de la Universidad de Sevillainstname:Universidad de Sevilla (US)InglésIEEE Transactions on Instrumentation and Measurement, 47 (2), 499-506.http://dx.doi.org/10.1109/19.744198info:eu-repo/semantics/openAccessoai:idus.us.es:11441/306612026-06-17T12:51:07Z
dc.title.none.fl_str_mv Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
title Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
spellingShingle Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
Roca Moreno, Elisenda
CMOS integrated circuits
Electrooptics measurements
Image sensors
Optical arrays
Photodetectors
title_short Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
title_full Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
title_fullStr Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
title_full_unstemmed Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
title_sort Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips
dc.creator.none.fl_str_mv Roca Moreno, Elisenda
Frutos Rayego, Fabián
Espejo Meana, Servando Carlos
Domínguez Castro, Rafael
Rodríguez Vázquez, Ángel Benito
author Roca Moreno, Elisenda
author_facet Roca Moreno, Elisenda
Frutos Rayego, Fabián
Espejo Meana, Servando Carlos
Domínguez Castro, Rafael
Rodríguez Vázquez, Ángel Benito
author_role author
author2 Frutos Rayego, Fabián
Espejo Meana, Servando Carlos
Domínguez Castro, Rafael
Rodríguez Vázquez, Ángel Benito
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Física Aplicada I
Electrónica y Electromagnetismo
dc.subject.none.fl_str_mv CMOS integrated circuits
Electrooptics measurements
Image sensors
Optical arrays
Photodetectors
topic CMOS integrated circuits
Electrooptics measurements
Image sensors
Optical arrays
Photodetectors
description Abstract—An electrooptical measurement system for the dc characterization of visible detectors for CMOS-compatible vision chips is presented, which can help designers to characterize these detectors. The measurement system has been designed to be versatile, fast, and easily expandable and used. Two different setups for the measurement of the spectral response and the optical dynamic range of the detectors are described in detail. Measurements of the spectral response are done with a fully computer-controlled setup, avoiding tedious and inaccurate measurements. A description of the different detectors available in a CMOS process is also given, together with the parameters affecting their response and a set of test structures which can be useful for the characterization of the detectors.
publishDate 1998
dc.date.none.fl_str_mv 1998
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/submittedVersion
format article
status_str submittedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11441/30661
https://doi.org/10.1109/19.744198
url http://hdl.handle.net/11441/30661
https://doi.org/10.1109/19.744198
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv IEEE Transactions on Instrumentation and Measurement, 47 (2), 499-506.
http://dx.doi.org/10.1109/19.744198
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv IEEE
publisher.none.fl_str_mv IEEE
dc.source.none.fl_str_mv reponame:idUS. Depósito de Investigación de la Universidad de Sevilla
instname:Universidad de Sevilla (US)
instname_str Universidad de Sevilla (US)
reponame_str idUS. Depósito de Investigación de la Universidad de Sevilla
collection idUS. Depósito de Investigación de la Universidad de Sevilla
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,301603

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