Cita APA

Roca Moreno, E., Frutos Rayego, F., Espejo Meana, S. C., Domínguez Castro, R., & Rodríguez Vázquez, Á. B. (1998). Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips.

Citación estilo Chicago

Roca Moreno, Elisenda, Fabián Frutos Rayego, Servando Carlos Espejo Meana, Rafael Domínguez Castro, y Ángel Benito Rodríguez Vázquez. Electrooptical Measurement System for the DC Characterization of Visible Detectors for CMOS-compatible Vision Chips. 1998.

Cita MLA

Roca Moreno, Elisenda, et al. Electrooptical Measurement System for the DC Characterization of Visible Detectors for CMOS-compatible Vision Chips. 1998.