Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature
[EN]This study investigates the performance of planar Gunn diodes based on highly doped Gallium Nitride using Monte Carlo simulations. The conversion efficiency is evaluated in geometrically V-shaped channels with an active region length of 500 nm, an input channel width of 200 nm, and output widths...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión enviada para evaluación y publicación |
| Fecha de publicación: | 2025 |
| País: | España |
| Institución: | Universidad de Salamanca (USAL) |
| Repositorio: | GREDOS. Repositorio Institucional de la Universidad de Salamanca |
| OAI Identifier: | oai:gredos.usal.es:10366/163596 |
| Acceso en línea: | http://hdl.handle.net/10366/163596 |
| Access Level: | acceso abierto |
| Palabra clave: | DC-to-ac conversion efficiency Doped gallium nitride (GaN) diode GaN Gunn diode Monte Carlo simulations Oscillation frequency |
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oai:gredos.usal.es:10366/163596 |
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Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and TemperatureSergio, García SánchezGonzález Sánchez, TomásMateos López, JavierDC-to-ac conversion efficiencyDoped gallium nitride (GaN) diodeGaNGunn diodeMonte Carlo simulationsOscillation frequency[EN]This study investigates the performance of planar Gunn diodes based on highly doped Gallium Nitride using Monte Carlo simulations. The conversion efficiency is evaluated in geometrically V-shaped channels with an active region length of 500 nm, an input channel width of 200 nm, and output widths of 200 nm, 220 nm, and 250 nm. The diodes are subjected to various biasing conditions to assess DC-to-AC conversion efficiency under different AC biases, simulating operating conditions similar to those found in tuned circuits (comprising R, L, and C elements). The efficiency is analyzed for an AC voltage of 2 V superimposed on a 20 V DC bias, considering four distinct doping levels in the active region. These devices demonstrate conversion efficiencies of up to 0.36 % at frequencies of 340 GHz for a channel doping level of N_D=1.0x10^18 cm-3 and an output width of 250 nm. The increase of lattice temperature reduces the efficiency of the diodes, although the obtained values indicate that the devices would still remain operational. Additionally, the frequency range where efficiency is positive (generation band) decreases as temperature increases.Institute of Electrical and Electronics Engineers202520252025info:eu-repo/semantics/articleinfo:eu-repo/semantics/submittedVersionapplication/pdfhttp://hdl.handle.net/10366/163596reponame:GREDOS. Repositorio Institucional de la Universidad de Salamancainstname:Universidad de Salamanca (USAL)Inglésinfo:eu-repo/semantics/openAccessoai:gredos.usal.es:10366/1635962026-06-07T06:28:51Z |
| dc.title.none.fl_str_mv |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| title |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| spellingShingle |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature Sergio, García Sánchez DC-to-ac conversion efficiency Doped gallium nitride (GaN) diode GaN Gunn diode Monte Carlo simulations Oscillation frequency |
| title_short |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| title_full |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| title_fullStr |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| title_full_unstemmed |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| title_sort |
Monte Carlo Analysis of DC–AC Conversion Efficiency in Highly Doped Planar GaN Gunn Diodes: Effects of Applied Bias, Doping Level, and Temperature |
| dc.creator.none.fl_str_mv |
Sergio, García Sánchez González Sánchez, Tomás Mateos López, Javier |
| author |
Sergio, García Sánchez |
| author_facet |
Sergio, García Sánchez González Sánchez, Tomás Mateos López, Javier |
| author_role |
author |
| author2 |
González Sánchez, Tomás Mateos López, Javier |
| author2_role |
author author |
| dc.subject.none.fl_str_mv |
DC-to-ac conversion efficiency Doped gallium nitride (GaN) diode GaN Gunn diode Monte Carlo simulations Oscillation frequency |
| topic |
DC-to-ac conversion efficiency Doped gallium nitride (GaN) diode GaN Gunn diode Monte Carlo simulations Oscillation frequency |
| description |
[EN]This study investigates the performance of planar Gunn diodes based on highly doped Gallium Nitride using Monte Carlo simulations. The conversion efficiency is evaluated in geometrically V-shaped channels with an active region length of 500 nm, an input channel width of 200 nm, and output widths of 200 nm, 220 nm, and 250 nm. The diodes are subjected to various biasing conditions to assess DC-to-AC conversion efficiency under different AC biases, simulating operating conditions similar to those found in tuned circuits (comprising R, L, and C elements). The efficiency is analyzed for an AC voltage of 2 V superimposed on a 20 V DC bias, considering four distinct doping levels in the active region. These devices demonstrate conversion efficiencies of up to 0.36 % at frequencies of 340 GHz for a channel doping level of N_D=1.0x10^18 cm-3 and an output width of 250 nm. The increase of lattice temperature reduces the efficiency of the diodes, although the obtained values indicate that the devices would still remain operational. Additionally, the frequency range where efficiency is positive (generation band) decreases as temperature increases. |
| publishDate |
2025 |
| dc.date.none.fl_str_mv |
2025 2025 2025 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/submittedVersion |
| format |
article |
| status_str |
submittedVersion |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10366/163596 |
| url |
http://hdl.handle.net/10366/163596 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.format.none.fl_str_mv |
application/pdf |
| dc.publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers |
| publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers |
| dc.source.none.fl_str_mv |
reponame:GREDOS. Repositorio Institucional de la Universidad de Salamanca instname:Universidad de Salamanca (USAL) |
| instname_str |
Universidad de Salamanca (USAL) |
| reponame_str |
GREDOS. Repositorio Institucional de la Universidad de Salamanca |
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GREDOS. Repositorio Institucional de la Universidad de Salamanca |
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15,81155 |