Experimental analysis of shot‐noise suppression in InGaAs/InAlAs recessed planar diodes at room temperature
In this work, current noise measurements of submicron InGaAs/InAlAs recessed planar diodes are presented. The presence of a barrier in the potential profile under the recess may affect the propagation statistics of the carriers, which in turn would lead to suppressed shot noise levels. However, evid...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2015 |
| País: | España |
| Institución: | Universidad de Salamanca (USAL) |
| Repositorio: | GREDOS. Repositorio Institucional de la Universidad de Salamanca |
| OAI Identifier: | oai:gredos.usal.es:10366/130681 |
| Acceso en línea: | http://hdl.handle.net/10366/130681 |
| Access Level: | acceso abierto |
| Palabra clave: | Shot noise Coulomb interaction InGaAs diodes |
| Sumario: | In this work, current noise measurements of submicron InGaAs/InAlAs recessed planar diodes are presented. The presence of a barrier in the potential profile under the recess may affect the propagation statistics of the carriers, which in turn would lead to suppressed shot noise levels. However, evidencing this noise suppression from the measurements is challenging, due to the undesired effects from the accesses and contact resistances. The presented results are provided as a starting point for a future de-embedding process to precisely determine the actual noise properties below the recess. |
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