Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]

Atomic force microscopy data, AFM data.- AFM images can be visualized with Gwyddion (free software)

Bibliographic Details
Author: Martín-Jiménez, Daniel
Format: conjunto de datos
Publication Date:2025
Country:España
Institution:Consejo Superior de Investigaciones Científicas (CSIC)
Repository:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/388498
Online Access:http://hdl.handle.net/10261/388498
https://doi.org/10.20350/digitalCSIC/17263
Access Level:Open access
Keyword:Organic thin films
Polycrystalline thin films
Grain boundaries
Atomic force microscopy
Bimodal AFM
Torsional eigenmode
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spelling Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]Martín-Jiménez, DanielOrganic thin filmsPolycrystalline thin filmsGrain boundariesAtomic force microscopyBimodal AFMTorsional eigenmodeAtomic force microscopy data, AFM data.- AFM images can be visualized with Gwyddion (free software)Complete data for article figures in txt. The data include force constants,frequencies, quality factors and sensitivities for the first, second, third flexural eigenmodes and torsional eigenmodeNoDIGITAL.CSICMartín-Jiménez, Daniel [0000-0002-2471-4206]Martín-Jiménez, DanielMartín-Jiménez, DanielMartín-Jiménez, DanielMartín-Jiménez, DanielConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202520252025info:eu-repo/semantics/datasethttp://purl.org/coar/resource_type/c_ddb1Txt and PDFhttp://hdl.handle.net/10261/388498https://doi.org/10.20350/digitalCSIC/17263reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)InglésBimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films; DOI: 10.1021/acs.nanolett.4c06499Data is in txt. They can be opened in Gwyddion (Optional)Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3884982026-05-22T06:33:51Z
dc.title.none.fl_str_mv Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
title Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
spellingShingle Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
Martín-Jiménez, Daniel
Organic thin films
Polycrystalline thin films
Grain boundaries
Atomic force microscopy
Bimodal AFM
Torsional eigenmode
title_short Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
title_full Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
title_fullStr Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
title_full_unstemmed Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
title_sort Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
dc.creator.none.fl_str_mv Martín-Jiménez, Daniel
author Martín-Jiménez, Daniel
author_facet Martín-Jiménez, Daniel
author_role author
dc.contributor.none.fl_str_mv Martín-Jiménez, Daniel [0000-0002-2471-4206]
Martín-Jiménez, Daniel
Martín-Jiménez, Daniel
Martín-Jiménez, Daniel
Martín-Jiménez, Daniel
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Organic thin films
Polycrystalline thin films
Grain boundaries
Atomic force microscopy
Bimodal AFM
Torsional eigenmode
topic Organic thin films
Polycrystalline thin films
Grain boundaries
Atomic force microscopy
Bimodal AFM
Torsional eigenmode
description Atomic force microscopy data, AFM data.- AFM images can be visualized with Gwyddion (free software)
publishDate 2025
dc.date.none.fl_str_mv 2025
2025
2025
dc.type.none.fl_str_mv info:eu-repo/semantics/dataset
http://purl.org/coar/resource_type/c_ddb1
format dataset
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/388498
https://doi.org/10.20350/digitalCSIC/17263
url http://hdl.handle.net/10261/388498
https://doi.org/10.20350/digitalCSIC/17263
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films; DOI: 10.1021/acs.nanolett.4c06499
Data is in txt. They can be opened in Gwyddion (Optional)
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv Txt and PDF
dc.publisher.none.fl_str_mv DIGITAL.CSIC
publisher.none.fl_str_mv DIGITAL.CSIC
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869409060724408320
score 15,812429

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