APA Citation

Martín-Jiménez, D. (2025). Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset].

Chicago Style Citation

Martín-Jiménez, Daniel. Bimodal Atomic Force Microscopy With a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]. 2025.

MLA Citation

Martín-Jiménez, Daniel. Bimodal Atomic Force Microscopy With a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]. 2025.

Warning: These citations may not always be 100% accurate.